scholarly journals Experimental Study of Diffusion Properties of Spinel LiMn2O4 Thin Film Electrodes and Their Characterization with In-situ Atomic Force Microscopy

2009 ◽  
Keyword(s):  
Thin Film ◽  
Experimental Study ◽  
Atomic Force Microscopy ◽  
Spinel Limn2o4 ◽  
Force Microscopy ◽  
Atomic Force ◽  
Thin Film Electrodes ◽  
Diffusion Properties

In situ atomic force microscopy studies on lithium (de)intercalation-induced morphology changes in LixCoO2 micro-machined thin film electrodes

2013 ◽  
Vol 222 ◽  
pp. 417-425 ◽  
Author(s):  
Jonghyun Park ◽  
Sergiy Kalnaus ◽  
Sangwoo Han ◽  
Yoon Koo Lee ◽  
Gregory B. Less ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Thin Film Electrodes ◽  
Morphology Changes

Direct Observation of SEI Formation and Lithiation in Thin-Film Silicon Electrodes via in Situ Electrochemical Atomic Force Microscopy

2019 ◽  
Vol 2 (9) ◽  
pp. 6761-6767 ◽  
Author(s):  
Svenja Benning ◽  
Chunguang Chen ◽  
Rüdiger-A. Eichel ◽  
Peter H. L. Notten ◽  
Florian Hausen
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Thin Film Silicon

Crystal Growth in Poly(L-lactide) Thin Film Revealed by in situ Atomic Force Microscopy

2003 ◽  
Vol 204 (15) ◽  
pp. 1822-1831 ◽  
Author(s):  
Yoshihiro Kikkawa ◽  
Hideki Abe ◽  
Masahiro Fujita ◽  
Tadahisa Iwata ◽  
Yoshio Inoue ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Force Microscopy ◽  
Atomic Force

Measuring Thickness Changes in Thin Films Due to Chemical Reaction by Monitoring the Surface Roughness with In Situ Atomic Force Microscopy

2002 ◽  
Vol 8 (5) ◽  
pp. 422-428 ◽  
Author(s):  
L.Y. Beaulieu ◽  
A.D. Rutenberg ◽  
J.R. Dahn
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Alloy Film ◽  
Force Microscopy ◽  
Atomic Force ◽  
Direct Proportionality ◽  
Roughness Measurements

Measuring the changing thickness of a thin film, without a reference, using an atomic force microscope (AFM) is problematic. Here, we report a method for measuring film thickness based on in situ monitoring of surface roughness of films as their thickness changes. For example, in situ AFM roughness measurements have been performed on alloy film electrodes on rigid substrates as they react with lithium electrochemically. The addition (or removal) of lithium to (or from) the alloy causes the latter to expand (or contract) reversibly in the direction perpendicular to the substrate and, in principle, the change in the overall height of these materials is directly proportional to the change in roughness. If the substrate on which the film is deposited is not perfectly smooth, a correction to the direct proportionality is needed and this is also discussed.

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force
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