Practical Considerations for Determining Thin Film Oxygen Surface Exchange Coefficients, Elastic Constants, Thermal Expansion Coefficients, Thermo-Chemically Induced Stresses, and Thermo-Chemically Induced Strains from Wafer Curvature Measurements

2018 ◽  
Vol MA2018-01 (32) ◽  
pp. 1942-1942
Author(s):  
Yuxi Ma ◽  
Jason D. Nicholas

A Multi-beam Optical Stress Sensor (MOSS) is a curvature measurement platform which is commonly used to measure the film stress in bilayer samples. It has been widely used as an in-situ technique to measure the film stress during deposition.1 However, when combined with the dual substrate method proposed by Zhao et al,2 in situ curvature measurements can be used to measure Young’s moduli and thermo-chemical expansion coefficients simultaneously as a function of temperature. Using the curvature relaxation (κR) technique developed recently,3-5 oxygen surface exchange coefficients (kchem) can also be measured as a function of temperature using in situ curvature measurements. In this work, the Young’s moduli, thermo-chemical expansion coefficients and kchem values of praseodymium doped ceria (PCO) were measured as a function of temperature using a MOSS. First, phase pure Pr0.1Ce0.9O1.95 (PCO) powder was prepared through glycine nitrate combustion and subsequent calcination at 1100oC in air. This powder was then pressed in a stainless-steel die and fired to 1450oC to produce a pulsed laser deposition (PLD) target. In preparation for PLD, (001) oriented 9.5% yttria doped zirconia (YSZ) and (001) oriented magnesium oxide (MgO) substrates (Crystec, GmbH) were pre-annealed at 1450oC for 20 hours to remove residual stress within them. PCO PLD was then conducted at 680oC for 20 min, with a 10-2 torr oxygen partial pressure and 350 mJ power density. After deposition, the PCO bilayers were re-equilibrated with air by firing them in air at 1000oC for 1 hour. For dual substrates measurements, stress vs. temperature data for PCO|YSZ and PCO|MgO were collected with a 1oC/min heating rate and a 0.2oC/min cooling rate. The slopes of the stress vs. temperature curves can be expressed by: dσPCO|YSZ/dT = MPCO(αYSZ-αPCO) (1) dσPCO|MgO/dT = MPCO(αMgO-αPCO) (2) where is the stress of bilayer sample, T is the temperature, M is the biaxial modulus of the film, is the thermo-chemical expansion coefficient. With two unknowns and two equations, and were then extracted as a function of temperature. The Young’s moduli were then calculated from assuming a Poisson’s ratio of 0.33 as has been done previously for 6. For κR measurements, relaxation data were recorded at 650~725oC with 25oC increments. The oxygen partial pressure was switched between synthetic air (20%O2-80%Ar) and 10% diluted synthetic air (10% synthetic air-90%Ar). Figure 1 shows the Young’s modulus and thermo-chemical expansion coefficients measured here compared to other literature studies.6-8 In contrast to other studies the present study produced PCO Young’s moduli over a complete range of temperatures. In addition, the PCO Young’s moduli started to decrease significantly once the PCO started to become nonstoichiometric (as indicated by an uptick in chemical expansion in Figure 1b). The PCO kchem values (not shown) were in good agreement with the kchem values measured by other electrode-free techniques, such as optical relaxation.9 Figure 1


1999 ◽  
Vol 14 (1) ◽  
pp. 2-4 ◽  
Author(s):  
Rui-sheng Liang ◽  
Feng-chao Liu

A new method is used in measuring the linear thermal expansion coefficients in composite consisting of a substrate Gd3Ga2Ga3O12 (GGG) and its epitaxial layer Y3Fe2Fe3O12 (YIG) within the temperature range 13.88 °C–32.50 °C. The results show that the thermal expansion coefficient of GGG in composite is larger than that of the GGG in single crystal; the thermal expansion coefficient of thick film YIG is also larger than that of thin film. The results also show that the thermal expansion coefficient of a composite consisting of film and its substrate can be measured by using a new method.


2012 ◽  
Vol 591-593 ◽  
pp. 965-968
Author(s):  
Jing Wang ◽  
Hong Lai Li ◽  
Mei Hua Liu

As a kind of wide band-gap material focused on in recent years, SnO2 thin Film with μm level has been widely applied in many fields such as solar cells, electric heating devices, transparent electrodes, and gas sensors, ect. This paper develops a real-time system to measure thermal expansion coefficients of SnO2 thin film, which can obtain directly surface morphology information of the samples. Micro-imaging and digital image correlation method is adopted to investigate the correlation by comparing the object surface image before deformation with that after deformation. Because of the lower demand for measurement environment and no damage to object, it’s easy to acquire on-line images, calculate synchronously and display real-time results. In the paper, thermal expansion coefficients of SnO2 thin film are determined in situ with change of the temperature. Both of ceramic and SnO2 thin film have shown anisotropy thermal expansion, thermal and residual stress appears between the ceramic substrate and SnO2 thin film as a result of thermal expansion coefficients mismatch. According to experimental results, the maximum stress values can be calculated between film and substrate and inside the substrate.


2019 ◽  
Vol 11 (9) ◽  
pp. 9102-9116 ◽  
Author(s):  
Ting Chen ◽  
George F. Harrington ◽  
Juveria Masood ◽  
Kazunari Sasaki ◽  
Nicola H. Perry

2019 ◽  
Vol 21 (13) ◽  
pp. 7183-7195 ◽  
Author(s):  
K. Develos-Bagarinao ◽  
J. De Vero ◽  
H. Kishimoto ◽  
T. Ishiyama ◽  
K. Yamaji ◽  
...  

Nanostructured LSCF thin films with more enhanced oxygen exchange properties also show a higher tendency to surface segregation.


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