In situ Investigations of Near Phase Boundary Water Diffusion of Ageing Adhesive Bonds by Scanning Kelvin Probe

2017 ◽  
Keyword(s):  
Phase Boundary ◽  
Water Diffusion ◽  
Kelvin Probe ◽  
Adhesive Bonds ◽  
Scanning Kelvin Probe

A scanning Kelvin probe for synchrotron investigations: thein situdetection of radiation-induced potential changes

2011 ◽  
Vol 19 (1) ◽  
pp. 48-53 ◽  
Author(s):  
Bekir Salgin ◽  
Dirk Vogel ◽  
Diego Pontoni ◽  
Heiko Schröder ◽  
Bernd Schönberger ◽  
...  
Keyword(s):  
High Performance ◽  
Structural Changes ◽  
Kelvin Probe ◽  
X Ray ◽  
Scanning Kelvin Probe ◽  
Wide Range ◽  
First Results ◽  
Radiation Induced ◽  
Set Up

A wide range of high-performance X-ray surface/interface characterization techniques are implemented nowadays at every synchrotron radiation source. However, these techniques are not always `non-destructive' because possible beam-induced electronic or structural changes may occur during X-ray irradiation. As these changes may be at least partially reversible, anin situtechnique is required for assessing their extent. Here the integration of a scanning Kelvin probe (SKP) set-up with a synchrotron hard X-ray interface scattering instrument for thein situdetection of work function variations resulting from X-ray irradiation is reported. First results, obtained on bare sapphire and sapphire covered by a room-temperature ionic liquid, are presented. In both cases a potential change was detected, which decayed and vanished after switching off the X-ray beam. This demonstrates the usefulness of a SKP forin situmonitoring of surface/interface potentials during X-ray materials characterization experiments.

On the use of scanning Kelvin probe for assessing in situ the delamination of adhesively bonded joints

2019 ◽  
Vol 157 ◽  
pp. 11-19
Author(s):  
B. Andreon ◽  
B.L. Guenther ◽  
W.L. Cavalcanti ◽  
L. Colombi Ciacchi ◽  
P. Plagemann
Keyword(s):  
Bonded Joints ◽  
Kelvin Probe ◽  
Adhesively Bonded ◽  
Adhesively Bonded Joints ◽  
Scanning Kelvin Probe

The scanning Kelvin probe; a new technique for the in situ analysis of the delamination of organic coatings

1996 ◽  
Vol 27 (1-4) ◽  
pp. 261-267 ◽  
Author(s):  
M. Stratmann ◽  
A. Leng ◽  
W. Fürbeth ◽  
H. Streckel ◽  
H. Gehmecker ◽  
...  
Keyword(s):  
Organic Coatings ◽  
In Situ Analysis ◽  
New Technique ◽  
Kelvin Probe ◽  
Scanning Kelvin Probe ◽  
A New Technique
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