A Real Time Electrochemical Analysis of Co-Sputtered (Co-Cr) and (Co-Cr-Mo) Alloy Thin Film Libraries in Ringer’s Solution at 37 oc

2021 ◽  
Vol MA2021-01 (18) ◽  
pp. 797-797
Author(s):  
Shaukat Ali Lone ◽  
Cezarina Cela Mardare ◽  
Andrei Ionut Mardare ◽  
Achim Walter Hassel
Author(s):  
R. Rajesh ◽  
R. Droopad ◽  
C. H. Kuo ◽  
R. W. Carpenter ◽  
G. N. Maracas

Knowledge of material pseudodielectric functions at MBE growth temperatures is essential for achieving in-situ, real time growth control. This allows us to accurately monitor and control thicknesses of the layers during growth. Undesired effusion cell temperature fluctuations during growth can thus be compensated for in real-time by spectroscopic ellipsometry. The accuracy in determining pseudodielectric functions is increased if one does not require applying a structure model to correct for the presence of an unknown surface layer such as a native oxide. Performing these measurements in an MBE reactor on as-grown material gives us this advantage. Thus, a simple three phase model (vacuum/thin film/substrate) can be used to obtain thin film data without uncertainties arising from a surface oxide layer of unknown composition and temperature dependence.In this study, we obtain the pseudodielectric functions of MBE-grown AlAs from growth temperature (650°C) to room temperature (30°C). The profile of the wavelength-dependent function from the ellipsometry data indicated a rough surface after growth of 0.5 μm of AlAs at a substrate temperature of 600°C, which is typical for MBE-growth of GaAs.


Author(s):  
Peng Lei ◽  
Congchun Zhang ◽  
Yawen Pang ◽  
Shenyong Yang ◽  
Meiju Zhang

2004 ◽  
Vol 43 (3) ◽  
pp. 1006-1012 ◽  
Author(s):  
Sung Hyuck An ◽  
Xuezhe Li ◽  
Sang Youl Kim

MRS Bulletin ◽  
1990 ◽  
Vol 15 (3) ◽  
pp. 45-52 ◽  
Author(s):  
A.M. Homola ◽  
C.M. Mate ◽  
G.B. Street

Metallic alloy thin film media and ever decreasing head-to-media spacing make severe demands on storage devices. Decreasing head-to-media separation is critical for high storage densities but it also leads to increased slider-disk interactions, which can cause slider and disk wear or even head crashes. Wear can also occur when drives start and stop when the slider contacts the disk at relatively high speeds. The reliability and durability of thin film disks, which provide much higher areal density than conventional oxide disks with particulate media, are achieved by the use of very thin overcoat materials and surface lubricants. This article summarizes the approaches taken in the industry to enhance the tribological performance of magnetic media, with special emphasis on the basic understanding of the processes occurring at the slider-disk interface.The continuous rise in the demand for storage capacity at a competitive price is the prime motivator of the changes we have seen in the data storage industry. It is clearly stimulating the present move away from particulate media, which has long dominated all fields of data storage, i.e., tape, rigid, and flexible disks, to the thin film storage media. Particulate storage devices use magnetic media formulated by dispersing magnetic particles, usually iron oxides, in an organic binder. In thin film storage devices, the storage medium is a continuous magnetic film, usually a cobalt alloy, made either by sputtering or by electroless plating.


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