Room-temperature synchrotron X-ray diffraction and subsequent detailed line profile analysis of Fe powder were performed for microstructural characterization. The peak shapes of the diffraction pattern of Fe were found to be super-Lorentzian in nature and the peak widths were anisotropically broadened. These peak profile features of the diffraction pattern are related to the microstructural parameters of the material. In order to elucidate these features of the diffraction pattern, detailed line (peak) profile analyses were performed using the Rietveld method, modified Williamson–Hall plots and whole powder pattern modelling (WPPM), and related microstructural parameters were determined. Profile fitting using the Rietveld and WPPM methods with a single microstructural (unimodal) model shows systematic deviation from the experimentally observed diffraction pattern. On the basis of Rietveld analysis and microstructural modelling it is revealed that the microstructure of Fe consists of two components (bimodal profile). The microstructural parameters of crystallite/domain size distribution, dislocation density, nature of dislocations and phase fraction were evaluated for both components. The results obtained using different methods are compared, and it is shown that diffraction peak profile analysis is capable of modelling such inhomogeneous bimodal microstructures.
Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis
