Proton Elastic Scattering Analysis—A Complement to Proton-Induced X-Ray Emission Analysis of Aerosols

1974 ◽  
Vol 18 ◽  
pp. 598-605
Author(s):  
J. William Nelson ◽  
Dennis L. Meinert

AbstractProton scattering quantitative elemental analysis is examined as a complement to proton induced X-ray emission analysis for air particulate samples. Both methods are absolute, non-destructive, and are suitable for use on samples up to about 1 mg/cm2 in areal density. Characteristics of the method are discussed and examples of aerosol spectra are presented.

The Analyst ◽  
2016 ◽  
Vol 141 (12) ◽  
pp. 3657-3667 ◽  
Author(s):  
Rachel S. Popelka-Filcoff ◽  
Claire E. Lenehan ◽  
Enzo Lombi ◽  
Erica Donner ◽  
Daryl L. Howard ◽  
...  

This manuscript presents the first comprehensive non-destructive micro elemental characterisation of mineral pigments used on Aboriginal Australian objects.


2020 ◽  
Author(s):  
Avupati Venkata Surya Satyanarayana ◽  
Mokka Jagannadharao ◽  
Kemburu Chandra Mouli ◽  
Kollu Sai Satya Mounika

Abstract. Particle Induced X-ray Emission (PIXE) has been applied to a analytical tool for long range of major, minor and trace elemental analysis in Precambrian charnockites. PIXE is sensitive and non-destructive method for some elemental analysis in a variety of Precambrian charnockite rocks down to levels of a few parts per million and it is not valid for all remaining elements in the composition. The elements identified in the Precambrian charnokite rock are Cl, K, Ca, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Se, Br, Rb, Sr, Y, Zr, Nb, Mo, Ru, Ag, Pb are identified without exact values by PIXE but the elements minor F, major elements Na, Mg, Al, Si, P and Ba and traces of Co, Th and U not detected due to various reasons even though there present in the charnockites, because of PIXE which is operation at 3 MeV energy and characterization material of charnockite mineral investigated. In mineral characterization of charnockite rocks, elemental errors in concentration of the compositions explained by comparing with present and previous studies.


2011 ◽  
Vol 2011 (DPC) ◽  
pp. 002160-002198
Author(s):  
Rudolf Schlangen ◽  
Herve Deslandes ◽  
Toru Toda ◽  
Toshinobu Nagatomo ◽  
Shigeki Sako ◽  
...  

Root cause analysis for package defects is currently performed by de-processing the package until such defects can be physically seen. However, many such defects within the package are removed, or are confused with defects created during de-processing itself. 3D X-ray has been used to analyze such physical defects within a packaged device in a non-destructive manner. However, the increasing density and associated shrinkage of components such as multi-layered substrates require significantly higher resolutions, which translates to longer times. High resolution X-ray is impractical when searching for a defect over a wide area due to the time to acquire detailed 3D images (~24 hrs). Thermal emission analysis has been widely used for localizing defects on ICs. Recent advancement in thermal emission camera technology coupled with lock-in thermography has allowed orders of magnitude better sensitivity ( < 1μW) and improvement in localization resolution (x,y to < 3 um). However, the application of lock-in thermography has been primarily limited to defect localization at the die level [1]. A a highly sensitive MWIR camera combined with a real time lock-in technique demonstrates the capability to localize defects within packaged devices, even through its mold compound. The technique accurately predicts the depth (z) of a thermal defect within the device (< + 5%) This paper will demonstrate multiple examples of the successful combination of advanced lock-in thermography analysis and high resolution 3D X-ray for totally non-destructive defect location within a packaged device. This initial accurate thermal localization in x, y and z enables the high resolution 3D X-ray system to focus analysis to a few microns so that the defect can be seen quickly (< 1 hr), enabling detection and analysis of previously undetected defects with highest throughput.


2021 ◽  
pp. 1950021
Author(s):  
Keizo Ishii ◽  
Atsuki Terakawa ◽  
Keitaro Hitomi ◽  
Mitsuhiro Nogami

We developed a 20[Formula: see text]MeV particle-induced X-ray emission (PIXE) analysis method using a medical cyclotron, which is conventionally used for positron emission tomography analysis performed in vacuo, during which the target sample is damaged. For non-destructive analysis and ease of switching between target samples, we developed a technique allowing 20[Formula: see text]MeV proton PIXE analysis to be performed at the atmospheric pressure. We filled the PIXE analysis chamber with helium and checked that the continuous background of the Compton tails of nuclear reaction [Formula: see text]-rays increased only minimally, and that the quasi-free electron bremsstrahlung (QFEB) did not increase at all, in the X-ray energy spectrum.


Metallomics ◽  
2015 ◽  
Vol 7 (5) ◽  
pp. 828-836 ◽  
Author(s):  
M. J. Ceko ◽  
K. Hummitzsch ◽  
N. Hatzirodos ◽  
R. J. Rodgers ◽  
H. H. Harris

Highlights how quantitative XRF can differentiate between biological structures in bovine ovaries on the basis of trace element distribution alone.


2003 ◽  
Vol 13 (03n04) ◽  
pp. 149-161 ◽  
Author(s):  
N. K. PURI ◽  
M. HAJIVALIEI ◽  
S. C. BEDI ◽  
N. SINGH ◽  
I. M. GOVIL ◽  
...  

As part of the study of trace elemental analysis of ancient Indian coins, twenty-five coins belonging to medieval period (11th-14th century A.D) and fifty-nine coins belonging to Kusanas (78-250 A.D) from India have been analysed using Proton Induced X-ray Emission (PIXE) technique. The elements S , Ca , Fe , Cu , Ag , Sn , Pb were detected in 11th-14th century A.D. coins while elements namely S , Cl , K , Ca , Ti , Cr , Mn , Fe , Ni , Cu , As and Zn were detected in most of the Kusanas coins. Based on the elemental analysis different hypotheses put forward in the earlier literature were examined. The presence of Pb determined in medieval period coins does not rule out the utilization of local source of silver extracted from argentiferous galena instead of the Faranjal mines of Afghanistan as normally accepted. From the consistent concentration of Ag in these coins despite the change of Kingdoms it is confirmed that beside the rulers the commercial communities had a great influence in the currency of medieval period. This is the first attempt where reasonable number of ancient coins belonging to different periods were analysed by modern non destructive multi-elemental technique such as PIXE and has put the importance of the elemental analysis of ancient Indian coins in the proper perspective.


2015 ◽  
Vol 87 (13) ◽  
pp. 6544-6552 ◽  
Author(s):  
Jan Garrevoet ◽  
Bart Vekemans ◽  
Stephen Bauters ◽  
Arne Demey ◽  
Laszlo Vincze

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