Identification of Leaf Rust Resistance Genes in Selected Egyptian Wheat Cultivars by Molecular Markers
Leaf rust, caused byPuccinia triticinaEriks., is a common and widespread disease of wheat (Triticum aestivumL.) in Egypt. Host resistance is the most economical, effective, and ecologically sustainable method of controlling the disease. Molecular markers help to determine leaf rust resistance genes (Lrgenes). The objective of this study was to identifyLrgenes in fifteen wheat cultivars from Egypt. Ten genes,Lr13,Lr19,Lr24,Lr26,Lr34,Lr35 Lr36,Lr37,Lr39, andLr46, were detected in fifteen wheat cultivars using various molecular markers. The most frequently occurring genes in fifteen Egyptian wheat cultivars wereLr13,Lr24,Lr34, andLr36identified in all the cultivars used, followed byLr26andLr35(93%),Lr39(66%),Lr37(53%), andLr46(26.6%) of the cultivars, and finallyLr19was present in 33.3% of cultivars. It is concluded that there was a good variation inLrgenes carried by wheat cultivars commercially grown in Egypt. Therefore, strategies for deploying resistance genes to prolong effective disease resistance are suggested to control wheat leaf rust disease.