Tin Oxide Thin Films Prepared by Thermal Evaporation Technique Under Different Vacuum Conditions

2012 ◽  
Vol 4 (3) ◽  
pp. 230-236 ◽  
Author(s):  
Parveen Jain ◽  
Sukhvir Singh ◽  
Azher Majid Siddqui ◽  
Avanish Kumar Srivastava
Keyword(s):  
Thin Films ◽  
Tin Oxide ◽  
Thermal Evaporation ◽  
Thermal Evaporation Technique ◽  
Oxide Thin Films ◽  
Evaporation Technique

scholarly journals STRUCTURAL ANALYSIS OF ZINC OXIDE THIN FILMS PREPARED BY THERMAL EVAPORATION TECHNIQUE

2017 ◽  
Vol 4 (3) ◽  
pp. 7-9
Author(s):  
Balaganesh A.s ◽  
Chandar Shekar B
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Structural Analysis ◽  
Thermal Evaporation ◽  
Structural Parameters ◽  
Xrd Analysis ◽  
Zno Films ◽  
Thermal Evaporation Technique ◽  
Oxide Thin Films ◽  
Evaporation Technique

Zinc oxide thin films of 800nm were successfully prepared by thermal evaporation technique. XRD analysis revealed polycrystalline nature of the as prepared ZnO films. The structural parameters such as crystallite size, dislocation density and micro strain were evaluated and discussed.

Structural and optical properties of Tin Oxide and Indium doped SnO2 thin films deposited by thermal evaporation technique

2016 ◽  
Vol 12 (3) ◽  
pp. 4394-4399
Author(s):  
Sura Ali Noaman ◽  
Rashid Owaid Kadhim ◽  
Saleem Azara Hussain
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Tin Oxide ◽  
Thermal Evaporation ◽  
Pure Sno2 ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Evaporation Technique ◽  
Sno2 Thin Films

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and Silicon  substrates  by  thermal evaporation technique.  X-ray diffraction pattern of  pure SnO2 and SnO2:In thin films annealed at 650oC and the results showed  that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pure  SnO2 and  Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.  Optical properties such as  Transmission , optical band-gap have been measured and calculated.

Ellipsometric analysis of Cd1−xZnxSe thin films prepared by a thermal evaporation technique

2011 ◽  
Vol 83 (6) ◽  
pp. 065706 ◽  
Author(s):  
Arshad Mahmood ◽  
Shaista R ◽  
A Shah ◽  
U Aziz ◽  
E Ahmed ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermal Evaporation ◽  
Thermal Evaporation Technique ◽  
Evaporation Technique

Electrical conductivity studies of mixed phthalocyanine thin films

Open Physics ◽  
2005 ◽  
Vol 3 (1) ◽  
Author(s):  
Abraham Varghese ◽  
C. Menon
Keyword(s):  
Thin Films ◽  
Electrical Conductivity ◽  
Room Temperature ◽  
Optical Band Gap ◽  
Thermal Evaporation ◽  
Copper Phthalocyanine ◽  
Thermal Evaporation Technique ◽  
Nickel Phthalocyanine ◽  
Mixed Films ◽  
Evaporation Technique

AbstractThin films of mixed of Copper Phthalocyanine (CuPc) and Nickel Phthalocyanine (NiPc) are deposited onto a pure glass substrate by a simultaneous thermal evaporation technique at room temperature. The material D.C. electrical conductivity of films at room temperature and also films annealed at 523 K has been investigated. The optical absorption and band gaps of the films are also measured. The results show that the electrical resistance is lower for the mixed films compared with the pure samples and also the optical band gap decreases for the mixed samples compared to the pure samples.

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