Process Variability Aware Low Leakage Reliable Nano Scale Double-Gate-FinFET SRAM Cell Design Technique
2015 ◽
Vol 10
(6)
◽
pp. 810-817
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Keyword(s):
2012 ◽
Vol 52
(6)
◽
pp. 1247-1252
◽
2008 ◽
Vol 23
(7)
◽
pp. 075049
◽
2016 ◽
Vol 94
(4)
◽
pp. 3513-3529
◽
Three-Dimensional Monolithic FinFET-Based 8T SRAM Cell Design for Enhanced Read Time and Low Leakage
2019 ◽
Vol 27
(4)
◽
pp. 899-912
◽