Comprehensive Study of the Surface Morphology Evolution Induced by Thermal Annealing in A-Plane ZnO Films on R-Plane Al2O3 Substrates

2016 ◽  
Vol 8 (2) ◽  
pp. 358-362 ◽  
Author(s):  
Dong-Cheol Oh ◽  
Soon-Ku Hong ◽  
Hang-Ju Ko
2005 ◽  
Vol 475-479 ◽  
pp. 1693-1696 ◽  
Author(s):  
Jian Dong Ye ◽  
Shu Lin Gu ◽  
Su Min Zhu ◽  
S.M. Liu ◽  
Feng Qin ◽  
...  

The morphology evolution of ZnO films grown on sapphire (0001) by MOCVD have been studied as a function of buffer growth time and temperature by means of atomic-force microscope (AFM), x-ray diffractions (XRD) and optical microscopy. When the buffer growth temperature decreased to 450°C, the surface became smooth greatly, indicating the transition from typical 3D island growth to quasi-2D growth mode. As the buffer growth time exceeds 5min, the micron-sized pit-like features are formed. It is due to the lack of stabilization of adatoms under the “etching” action of ionized O2/Ar during high temperature buffer annealing


2010 ◽  
pp. 166-192
Author(s):  
Y. Q. Fu ◽  
W. M. Huang ◽  
M. Cai ◽  
S. Zhang

2005 ◽  
pp. 1693-1696
Author(s):  
Jian Dong Ye ◽  
Shu Lin Gu ◽  
Su Min Zhu ◽  
S.M. Liu ◽  
Feng Qin ◽  
...  

Nanoscale ◽  
2018 ◽  
Vol 10 (45) ◽  
pp. 21161-21167 ◽  
Author(s):  
Yanchao Xu ◽  
Xiaoqiang Cui ◽  
Kun Qi ◽  
Shuting Wei ◽  
Qiyu Wang ◽  
...  

The surface morphology evolution of Au@Pd core–shell nanorods was controlled by adjusting the solution supersaturation.


2014 ◽  
Vol 455 (1-3) ◽  
pp. 189-193
Author(s):  
J.J. Yang ◽  
F.M. Miao ◽  
H.L. Zhu ◽  
X.Y. Shu ◽  
B. Huang ◽  
...  

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