Numerical analysis of trajectories in a Cassinian ion trap of second order with trap door ion inlet

2021 ◽  
Vol 27 (1) ◽  
pp. 3-12
Author(s):  
Bjoern Raupers ◽  
Hana Medhat ◽  
Juergen Grotemeyer ◽  
Frank Gunzer
Keyword(s):  
Ion Trap ◽  
Ion Traps ◽  
Second Order ◽  
Resolving Power ◽  
Periodic Pattern ◽  
Ion Motion ◽  
Trap Door ◽  
Mass Resolving Power ◽  
Long Time ◽  
The Fourier Transform

Ion traps like the Orbitrap are well known mass analyzers with very high resolving power. This resolving power is achieved with help of ions orbiting around an inner electrode for long time, in general up to a few seconds, since the mass signal is obtained by calculating the Fourier Transform of the induced signal caused by the ion motion. A similar principle is applied in the Cassinian Ion Trap of second order, where the ions move in a periodic pattern in-between two inner electrodes. The Cassinian ion trap has the potential to offer mass resolving power comparable to the Orbitrap with advantages regarding the experimental implementation. In this paper we have investigated the details of the ion motion analyzing experimental data and the results of different numerical methods, with focus on increasing the resolving power by increasing the oscillation frequency for ions in a high field ion trap. In this context the influence of the trap door, a tunnel through which the ions are injected into the trap, on the ion velocity becomes especially important.

Calculation of the Ion Optical Properties of Inhomogeneous Magnetic Sector Fields Part 3: Oblique Incidence and Exit at Curved Boundaries

1959 ◽  
Vol 14 (9) ◽  
pp. 822-827 ◽  
Author(s):  
H. A. Tasman ◽  
A. J. H. Boerboom ◽  
H. Wachsmuth
Keyword(s):  
Oblique Incidence ◽  
Normal Incidence ◽  
Second Order ◽  
Resolving Power ◽  
High Mass ◽  
Curved Boundaries ◽  
Magnetic Sector ◽  
Mass Resolving Power ◽  
Mass Dispersion ◽  
Fringing Fields

In previous papers 1.2we presented the radial second order imaging properties of inhomogeneous magnetic sector fields with normal incidence and exit at plane boundaries. These fields may provide very high mass resolving power and mass dispersion without increase in radius or decrease of slit widths. In the present paper the calculations are extended to include the effect of oblique incidence and exit at curved boundaries. The influence of the fringing fields on axial focusing when the boundaries are oblique, is accounted for. It is shown that the second order angular aberration may Le eliminated by appropriate curvature of the boundaries.

Influence of Mass Resolving Power in Orbital Ion-Trap Mass Spectrometry-Based Metabolomics

2016 ◽  
Vol 88 (23) ◽  
pp. 11429-11435 ◽  
Author(s):  
Lukáš Najdekr ◽  
David Friedecký ◽  
Ralf Tautenhahn ◽  
Tomáš Pluskal ◽  
Junhua Wang ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Ion Trap ◽  
Resolving Power ◽  
Ion Trap Mass Spectrometry ◽  
Mass Resolving Power

Axial ion motion within the quadrupole ion trap elucidated by dc pulse tomography

2000 ◽  
Vol 194 (2-3) ◽  
pp. 225-234 ◽  
Author(s):  
Carsten Weil ◽  
J.Mitchell Wells ◽  
H Wollnik ◽  
R.Graham Cooks
Keyword(s):  
Ion Trap ◽  
Quadrupole Ion Trap ◽  
Ion Motion

On the Field Evaporation Behavior of a Model Ni-Al-Cr Superalloy Studied by Picosecond Pulsed-Laser Atom-Probe Tomography

2008 ◽  
Vol 14 (6) ◽  
pp. 571-580 ◽  
Author(s):  
Yang Zhou ◽  
Christopher Booth-Morrison ◽  
David N. Seidman
Keyword(s):  
Atom Probe Tomography ◽  
Mass Spectra ◽  
Pulsed Laser ◽  
Picosecond Laser ◽  
Atom Probe ◽  
Resolving Power ◽  
Noise Levels ◽  
Thermally Activated ◽  
Mass Resolving Power

AbstractThe effects of varying the pulse energy of a picosecond laser used in the pulsed-laser atom-probe (PLAP) tomography of an as-quenched Ni-6.5 Al-9.5 Cr at.% alloy are assessed based on the quality of the mass spectra and the compositional accuracy of the technique. Compared to pulsed-voltage atom-probe tomography, PLAP tomography improves mass resolving power, decreases noise levels, and improves compositional accuracy. Experimental evidence suggests that Ni2+, Al2+, and Cr2+ ions are formed primarily by a thermally activated evaporation process, and not by post-ionization of the ions in the 1+ charge state. An analysis of the detected noise levels reveals that for properly chosen instrument parameters, there is no significant steady-state heating of the Ni-6.5 Al-9.5 Cr at.% tips during PLAP tomography.

Stability of ion motion in the quadrupole ion trap driven by rectangular waveform voltages

2003 ◽  
Vol 230 (1) ◽  
pp. 65-70 ◽  
Author(s):  
Won-Wook Lee ◽  
Soon-Ki Min ◽  
Cha-Hwan Oh ◽  
Pill-Soo Kim ◽  
Seok-Ho Song ◽  
...  
Keyword(s):  
Ion Trap ◽  
Quadrupole Ion Trap ◽  
Ion Motion ◽  
Rectangular Waveform

Understanding of Capping Effects on the Tip Shape Evolution and on the Atom Probe Data of Bulk LaAlO3 Using Transmission Electron Microscopy

2017 ◽  
Vol 23 (2) ◽  
pp. 329-335 ◽  
Author(s):  
Chang-Min Kwak ◽  
Young-Tae Kim ◽  
Chan-Gyung Park ◽  
Jae-Bok Seol
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atom Probe ◽  
Resolving Power ◽  
Shape Evolution ◽  
Oxide Materials ◽  
Field Evaporation ◽  
Laser Illumination ◽  
Transmission Electron ◽  
Mass Resolving Power

AbstractTwo challenges exist in laser-assisted atom probe tomography (APT). First, a drastic decline in mass-resolving power is caused, not only by laser-induced thermal effects on the APT tips of bulk oxide materials, but also the associated asymmetric evaporation behavior; second, the field evaporation mechanisms of bulk oxide tips under laser illumination are still unclear due to the complex relations between laser pulse and oxide materials. In this study, both phenomena were investigated by depositing Ni- and Co-capping layers onto the bulk LaAlO3 tips, and using stepwise APT analysis with transmission electron microscopy (TEM) observation of the tip shapes. By employing the metallic capping, the heating at the surface of the oxide tips during APT analysis became more symmetrical, thereby enabling a high mass-resolving power in the mass spectrum. In addition, the stepwise microscopy technique visualized tip shape evolution during APT analysis, thereby accounting for evaporation sequences at the tip surface. The combination of “capping” and “stepwise APT with TEM,” is applicable to any nonconductors; it provides a direct observation of tip shape evolution, allows determination of the field evaporation strength of oxides, and facilitates understanding of the effects of ultrafast laser illumination on an oxide tip.

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