An electron-microscope study of peristerite plagioclases

1965 ◽  
Vol 35 (269) ◽  
pp. 165-176 ◽  
Author(s):  
S. G. Fleet ◽  
P. H. Ribbe
Keyword(s):  
Electron Microscopy ◽  
Heat Treatment ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Microscope Study ◽  
Lamellar Structure ◽  
Electron Microscope Study ◽  
Transmission Electron

SummaryPlagioclase feldspars in the peristerite range An2-An17 have been investigated by transmission electron-microscopy and electron diffraction. All except the more anorthite-rich specimens were found to be unmixed into albite and oligoclase lamellae, between a few hundred and several thousand Å thick and approximately parallel to . A discussion is given of the part played by these lamellae when optical schiller is exhibited; and the effect of heat treatment on the lamellar structure and optical schiller is described.

Electron Microscope Study of Revolving Crystal Growth of Ý–Type Vanadium Oxide Hydrate Under Hydrothermal Conditions

1994 ◽  
Vol 346 ◽  
Author(s):  
S. Kittaka ◽  
H. Miyahara ◽  
Y. Yokota
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Crystal Growth ◽  
Vanadium Oxide ◽  
Microscope Study ◽  
Electron Microscope Study ◽  
Hydrothermal Conditions ◽  
Oxide Hydrate ◽  
Transmission Electron

ABSTRACTAnomalous revolving stacking crystal growth of β-type vanadium oxide hydrate formed by hydrothermal treatment was studied by transmission electron microscopy.

Characterization of submicrometer fluid Inclusions in minerals by Analytical/Transmission Electron Microscopy and electron diffraction

1990 ◽  
Vol 48 (4) ◽  
pp. 424-424
Author(s):  
George Guthrie ◽  
David Veblen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Light Microscopy ◽  
Fluid Inclusions ◽  
Energy Dispersive Spectrometer ◽  
Analytical Transmission Electron Microscopy ◽  
Transmission Electron

The nature of a geologic fluid can often be inferred from fluid-filled cavities (generally <100 μm in size) that are trapped during the growth of a mineral. A variety of techniques enables the fluids and daughter crystals (any solid precipitated from the trapped fluid) to be identified from cavities greater than a few micrometers. Many minerals, however, contain fluid inclusions smaller than a micrometer. Though inclusions this small are difficult or impossible to study by conventional techniques, they are ideally suited for study by analytical/ transmission electron microscopy (A/TEM) and electron diffraction. We have used this technique to study fluid inclusions and daughter crystals in diamond and feldspar.Inclusion-rich samples of diamond and feldspar were ion-thinned to electron transparency and examined with a Philips 420T electron microscope (120 keV) equipped with an EDAX beryllium-windowed energy dispersive spectrometer. Thin edges of the sample were perforated in areas that appeared in light microscopy to be populated densely with inclusions. In a few cases, the perforations were bound polygonal sides to which crystals (structurally and compositionally different from the host mineral) were attached (Figure 1).

Transmission Electron Microscope Study of Interfacial Reactions in Gold-Germanium Contact to Gallium Arsenide

1985 ◽  
Vol 54 ◽  
Author(s):  
Taeil Kim ◽  
D.D.L. Chung
Keyword(s):  
Electron Microscopy ◽  
Solid Solution ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Electron Microscope Study ◽  
Lattice Match ◽  
Perfect Lattice ◽  
Transmission Electron ◽  
Transmission Electron Microscope Study

ABSTRACTThe structure of 500 Å Au/500 A Ge/500 Å Au/GaAs (100) was studied by transmission electron microscopy after annealing at 350 – 500°C. Annealing at 350 – 450°C caused the formation of AuGeAs with a (110) texture, but this phase disappeared after annealing at 500°C. The hexagonal a-AuGa (or AuGa) was formed after annealing at 400°C, such that (111)Au // (0001)a, and [110]AU // [1120]a and there was perfect lattice match between Au (i.e., Au-rich solid solution) and a-AuGa. After annealing at 450°C or above, a phase tentatively identified as the hexagonal Au3Ga was formed and Ge (i.e., Ge-rich solid solution) became epitaxial to (100) GaAs. Annealing at 400°C caused Au to change from no texture to a (110) texture.

Precipitation Reactions in Zinc-Copper-Titanium Alloys

1974 ◽  
Vol 32 ◽  
pp. 490-491
Author(s):  
P. Viatour ◽  
J. P. Veyt
Keyword(s):  
Electron Microscopy ◽  
Heat Treatment ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Titanium Alloys ◽  
Transmission Electron ◽  
Precipitation Reactions ◽  
Rolled Condition ◽  
Hot Rolled

Samples of zinc-copper-0.15 titanium alloys were examined by transmission electron microscopy as well as with a combined electron microscope- microanalyser apparatus EMMA-4. These samples have copper contents ranging from 0.5 to 2.5 wt. % and were examined in the hot-rolled condition as well as after a 250°C/1h/a. c. heat treatment.

Trophozoites of Pathogenic Naegleria: Scanning Electron Microscope Study

1975 ◽  
Vol 33 ◽  
pp. 652-653
Author(s):  
A. Julio Martinez ◽  
E. Clifford Nelson ◽  
Doris G. Fultz ◽  
Ragnit Geeraets
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Electron Microscope Study ◽  
Plastic Film ◽  
Scanning Electron Microscope Study ◽  
Transmission Electron ◽  
Scanning Electron

Scanning electron microscopy (SEM) can serve as a valuable supplement to transmission electron microscopy (TEM) in the study of pathogenic protozoa. Details of overall form and structure of surface and organelles which may have a role in pathogenicity may be revealed. TEM studies on Naegleria have contributed much to understanding the extraordinary virulence of this ameba, but some remaining questions may be resolved by SEM. This report describes a technique which has proven useful in preparing SEM specimens. Naegleria ameba trophozoites adhere strongly to the surface on which they are growing. In culture tubes, amebae will multiply on the wall. Naegleria tends to grow from the top of the fluid downward and may multiply until a solid monolayer develops. If a strip of plastic film is introduced, the growth on the strip can be observed by direct microscope viewing through the wall of the tube.

Phenomena Associated with Oxygen in Titanium

1967 ◽  
Vol 25 ◽  
pp. 310-311
Author(s):  
E. U. Lee ◽  
P. A. Garner ◽  
J. S. Owens
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Microstructural Changes ◽  
Electrolytic Polishing ◽  
Interstitial Impurities ◽  
Thin Foils ◽  
Transmission Electron ◽  
Iodide Titanium ◽  
Alpha Titanium

Evidence for ordering (1-6) of interstitial impurities (O and C) has been obtained in b.c.c. metals, such as niobium and tantalum. In this paper we report the atomic and microstructural changes in an oxygenated c.p.h. metal (alpha titanium) as observed by transmission electron microscopy and diffraction.Oxygen was introduced into zone-refined iodide titanium sheets of 0.005 in. thickness in an atmosphere of oxygen and argon at 650°C, homogenized at 800°C and furnace-cooled in argon. Subsequently, thin foils were prepared by electrolytic polishing and examined in a JEM-7 electron microscope, operated at 100 KV.

The 1-MeV Electron Microscope Installation at the University of Colorado

1973 ◽  
Vol 31 ◽  
pp. 8-9 ◽  
Author(s):  
Mircea Fotino
Keyword(s):  
Electron Microscopy ◽  
Developmental Biology ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
National Institutes Of Health ◽  
Experimental Program ◽  
University Of Colorado ◽  
Transmission Electron ◽  
The University ◽  
Research Resources

A new 1-MeV transmission electron microscope (Model JEM-1000) was installed at the Department of Molecular, Cellular and Developmental Biology of the University of Colorado in Boulder during the summer and fall of 1972 under the sponsorship of the Division of Research Resources of the National Institutes of Health. The installation was completed in October, 1972. It is installed primarily for the study of biological materials without many of the limitations hitherto unavoidable in standard transmission electron microscopy. Only the technical characteristics of the installation are briefly reviewed here. A more detailed discussion of the experimental program under way is being published elsewhere.

Transmission Electron Microscopy of Epitaxial silicides grown by ultra high vacuum deposition

1989 ◽  
Vol 47 ◽  
pp. 462-463
Author(s):  
D. Loretto ◽  
J. M. Gibson ◽  
S. M. Yalisove
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
High Vacuum ◽  
High Energy ◽  
Energy Electron ◽  
Ultra High Vacuum ◽  
Ex Situ ◽  
Transmission Electron

The silicides CoSi2 and NiSi2 are both metallic with the fee flourite structure and lattice constants which are close to silicon (1.2% and 0.6% smaller at room temperature respectively) Consequently epitaxial cobalt and nickel disilicide can be grown on silicon. If these layers are formed by ultra high vacuum (UHV) deposition (also known as molecular beam epitaxy or MBE) their thickness can be controlled to within a few monolayers. Such ultrathin metal/silicon systems have many potential applications: for example electronic devices based on ballistic transport. They also provide a model system to study the properties of heterointerfaces. In this work we will discuss results obtained using in situ and ex situ transmission electron microscopy (TEM).In situ TEM is suited to the study of MBE growth for several reasons. It offers high spatial resolution and the ability to penetrate many monolayers of material. This is in contrast to the techniques which are usually employed for in situ measurements in MBE, for example low energy electron diffraction (LEED) and reflection high energy electron diffraction (RHEED), which are both sensitive to only a few monolayers at the surface.

Structural Investigation of Iron Particles Used for Magnetic Recording Media

1980 ◽  
Vol 38 ◽  
pp. 406-407
Author(s):  
Alfred Baltz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Structural Investigation ◽  
Magnetic Interaction ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Recording Medium ◽  
Iron Particles ◽  
Transmission Electron

As part of a program to develop iron particles for next generation recording disk medium, their structural properties were investigated using transmission electron microscopy and electron diffraction. Iron particles are a more desirable recording medium than iron oxide, the most widely used material in disk manufacturing, because they offer a higher magnetic output and a higher coercive force. The particles were prepared by a method described elsewhere. Because of their strong magnetic interaction, a method had to be developed to separate the particles on the electron microscope grids.

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