A Review of Database System Terminology

2021 ◽  
pp. 13-31
Author(s):  
Marion G. Ceruti
Keyword(s):  
1996 ◽  
Vol 35 (03) ◽  
pp. 261-264 ◽  
Author(s):  
T. Schromm ◽  
T. Frankewitsch ◽  
M. Giehl ◽  
F. Keller ◽  
D. Zellner

Abstract:A pharmacokinetic database was constructed that is as free of errors as possible. Pharmacokinetic parameters were derived from the literature using a text-processing system and a database system. A random data sample from each system was compared with the original literature. The estimated error frequencies using statistical methods differed significantly between the two systems. The estimated error frequency in the text-processing system was 7.2%, that in the database system 2.7%. Compared with the original values in the literature, the estimated probability of error for identical pharmacokinetic parameters recorded in both systems is 2.4% and is not significantly different from the error frequency in the database. Parallel data entry with a text-processing system and a database system is, therefore, not significantly better than structured data entry for reducing the error frequency.


1996 ◽  
Vol 8 (3) ◽  
pp. 160-168 ◽  
Author(s):  
Janet Burt ◽  
Tom Beaumont James

This article discusses the different approaches to the treatment of historical databases: the relational database system and κλειω, a source-oriented approach.


2013 ◽  
Vol 1 (1) ◽  
pp. 1-3
Author(s):  
Faisal Halim ◽  
◽  
Rizal Muttaqin ◽  
Keyword(s):  

Author(s):  
Yinhan Gao ◽  
Wenzhi Wu ◽  
Jie Liang ◽  
Litong Zhang ◽  
Kun Qian ◽  
...  

2006 ◽  
Vol 16 (1) ◽  
pp. 28-38
Author(s):  
Etsuko INOUE ◽  
Takuya YOSHIHIRO ◽  
Hideya KAWAJI ◽  
Akira HORIBATA ◽  
Masaru NAKAGAWA

Author(s):  
Alexander Sorkin ◽  
Chris Pawlowicz ◽  
Alex Krechmer ◽  
Michael W. Phaneuf

Abstract Competitive circuit analysis of Integrated Circuits (ICs) is one of the most challenging types of analysis. It involves multiple complex IC die de-processing/de-layering steps while keeping precise planarity from metal layer to metal layer. Each step is followed by Scanning Electron Microscope (SEM) imaging together with mosaicking that subsequently passes through an image recognition and Graphic Database System (GDS) conversion process. This conventional procedure is quite time and resource consuming. The current paper discusses and demonstrates a new inventive methodology of circuit tracing on an IC using known FIB Passive Voltage Contrast (PVC) effects [1]. This technique provides significant savings in time and resources.


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