Hot Carrier Spin Transport in Ferromagnetic Metals

2016 ◽  
pp. 196-213
Keyword(s):  
Spin Transport ◽  
Hot Carrier ◽  
Ferromagnetic Metals

scholarly journals Magnetoelectric interfaces and spin transport

2012 ◽  
Vol 370 (1977) ◽  
pp. 4840-4855 ◽  
Author(s):  
J. D. Burton ◽  
E. Y. Tsymbal
Keyword(s):  
Spin Transport ◽  
Electronic Devices ◽  
Ferromagnetic Metals ◽  
Spin Degree ◽  
Electric Control ◽  
Spin Dependent Transport ◽  
Material Systems ◽  
Dependent Transport ◽  
Ferroelectric Oxides ◽  
Theory And Experiment

Engineered heterostructures designed for electric control of magnetic properties, the so-called magnetoelectric interfaces , present a novel route towards using the spin degree of freedom in electronic devices. Here, we review how a subset of such interfaces, namely ferromagnet–ferroelectric heterostructures, display electronically mediated control of magnetism and, in particular, emphasis is placed on how these effects manifest themselves as detectable spin-dependent transport phenomena. Examples of these effects are given for a variety of material systems on the basis of ferroelectric oxides, manganese and ruthenium magnetic complex oxides and elemental ferromagnetic metals. Results from both theory and experiment are discussed.

Spin Transport in Ferromagnetic Metals

1966 ◽  
Vol 141 (2) ◽  
pp. 503-506 ◽  
Author(s):  
L. L. Hirst
Keyword(s):  
Spin Transport ◽  
Ferromagnetic Metals

A NEW ANALYSIS OF NEUTRON DIFFRACTION IN FERROMAGNETIC METALS

1971 ◽  
Vol 32 (C1) ◽  
pp. C1-818-C1-819
Author(s):  
D. J. KIM ◽  
B. B. SCHWARTZ ◽  
H. C. PRADDAUDE
Keyword(s):  
Neutron Diffraction ◽  
Ferromagnetic Metals

PERIODIC OSCILLATIONS AND TURBULENCE OF HOT-CARRIER PLASMA AT 4.2 K IN n-GaAs

1981 ◽  
Vol 42 (C7) ◽  
pp. C7-51-C7-56
Author(s):  
K. Aoki ◽  
T. Kobayashi ◽  
K. Yamamoto
Keyword(s):  
Periodic Oscillations ◽  
Hot Carrier

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Induced Changes

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-787-C4-790
Author(s):  
P. T.J. BIERMANS ◽  
T. POORTER ◽  
H. J.H. MERKS-EPPINGBROEK
Keyword(s):  
Hot Carrier ◽  
The Impact ◽  
Hot Carrier Degradation
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