THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS
1988 ◽
Vol 49
(C4)
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pp. C4-787-C4-790
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2019 ◽
Vol 40
(6)
◽
pp. 870-873
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2002 ◽
Vol 12
(3)
◽
pp. 11-14
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1995 ◽
Vol 30
(6)
◽
pp. 644-649
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1993 ◽
Vol 140
(6)
◽
pp. 431
◽
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