ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Deuterium isotope effect for AC and DC hot-carrier degradation of MOS transistors: a comparison study

2001 ◽  
Vol 48 (4) ◽  
pp. 813-815
Author(s):  
Zhi Chen ◽  
Kangguo Cheng ◽  
Jinju Lee ◽  
J.W. Lyding ◽  
K. Hess ◽  
...  
Keyword(s):  
Isotope Effect ◽  
Comparison Study ◽  
Mos Transistors ◽  
Deuterium Isotope Effect ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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