Thermal effects accompanying the deformation of natural rubber

Abstract The crystalline structure of stretched natural rubber has been the subject of much experimental work in the past. A great deal of this has been devoted to the more theoretical aspects, such as x-ray patterns, thermal effects, and volume change. It is now known that neither Buna-N nor GR-S has a fiber diagram when stretched and that Butyl-B and Neoprene do have such patterns. Since the industry is now in the process of changing from natural rubber to GR-S, it is of interest to see just what this lack of crystallinity means from a compounding and performance standpoint. It is possible that many of our ideas based on rubber must change, that GR-S must be considered to be a new material, and that radical changes in formulation and construction must be made.

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Thermal effects accompanying the deformation of natural rubber

Constitutive Models for Rubber VIII ◽

10.1201/b14964-94 ◽

2013 ◽

pp. 523-528

Keyword(s):

Natural Rubber ◽

Thermal Effects

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THERMODYNAMICS, THERMAL EFFECTS AND DILATATION OF NATURAL RUBBER

10.21236/ad0644112 ◽

1966 ◽

Author(s):

Michel Boel ◽

Frederick Eirich

Keyword(s):

Natural Rubber ◽

Thermal Effects

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Thermal Considerations in Lens Regulator Systems

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100068783 ◽

1970 ◽

Vol 28 ◽

pp. 358-359

Author(s):

K.C. Newton

Keyword(s):

Electron Microscope ◽

Thermal Effects ◽

Environmental Control ◽

Reference Networks ◽

Better Than

Thermal effects in lens regulator systems have become a major problem with the extension of electron microscope resolution capabilities below 5 Angstrom units. Larger columns with immersion lenses and increased accelerating potentials have made solutions more difficult by increasing the power being handled. Environmental control, component choice, and wiring design provide answers, however. Figure 1 indicates with broken lines where thermal problems develop in regulator systemsExtensive environmental control is required in the sampling and reference networks. In each case, stability better than I ppm/min. is required. Components with thermal coefficients satisfactory for these applications without environmental control are either not available or priced prohibitively.

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Direct measurement of electron-diffraction-pattern intensities using an energy loss spectrometer

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100155311 ◽

1989 ◽

Vol 47 ◽

pp. 668-669

Author(s):

A. G. Jackson ◽

M. Rowe

Keyword(s):

Thermal Effects ◽

Dynamic Range ◽

Scattering Amplitude ◽

Dynamical Theory ◽

Site Symmetry ◽

Proof Of Concept ◽

Parallel Acquisition ◽

Kinematic Approximation ◽

Speed Up ◽

Structure Calculations

Diffraction intensities from intermetallic compounds are, in the kinematic approximation, proportional to the scattering amplitude from the element doing the scattering. More detailed calculations have shown that site symmetry and occupation by various atom species also affects the intensity in a diffracted beam. [1] Hence, by measuring the intensities of beams, or their ratios, the occupancy can be estimated. Measurement of the intensity values also allows structure calculations to be made to determine the spatial distribution of the potentials doing the scattering. Thermal effects are also present as a background contribution. Inelastic effects such as loss or absorption/excitation complicate the intensity behavior, and dynamical theory is required to estimate the intensity value.The dynamic range of currents in diffracted beams can be 104or 105:1. Hence, detection of such information requires a means for collecting the intensity over a signal-to-noise range beyond that obtainable with a single film plate, which has a S/N of about 103:1. Although such a collection system is not available currently, a simple system consisting of instrumentation on an existing STEM can be used as a proof of concept which has a S/N of about 255:1, limited by the 8 bit pixel attributes used in the electronics. Use of 24 bit pixel attributes would easily allowthe desired noise range to be attained in the processing instrumentation. The S/N of the scintillator used by the photoelectron sensor is about 106 to 1, well beyond the S/N goal. The trade-off that must be made is the time for acquiring the signal, since the pattern can be obtained in seconds using film plates, compared to 10 to 20 minutes for a pattern to be acquired using the digital scan. Parallel acquisition would, of course, speed up this process immensely.

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Extraction and identification of fillers and pigments from pyrolyzed rubber and tire samples

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100163332 ◽

1996 ◽

Vol 54 ◽

pp. 174-175

Author(s):

P. Sadhukhan ◽

J. B. Zimmerman

Keyword(s):

Zinc Oxide ◽

Electron Microscope ◽

Carbon Black ◽

Natural Rubber ◽

Transmission Electron Microscope ◽

Rolling Resistance ◽

Synthetic Polymers ◽

Nitrogen Atmosphere ◽

Transmission Electron ◽

Curing Agents

Rubber stocks, specially tires, are composed of natural rubber and synthetic polymers and also of several compounding ingredients, such as carbon black, silica, zinc oxide etc. These are generally mixed and vulcanized with additional curing agents, mainly organic in nature, to achieve certain “designing properties” including wear, traction, rolling resistance and handling of tires. Considerable importance is, therefore, attached both by the manufacturers and their competitors to be able to extract, identify and characterize various types of fillers and pigments. Several analytical procedures have been in use to extract, preferentially, these fillers and pigments and subsequently identify and characterize them under a transmission electron microscope.Rubber stocks and tire sections are subjected to heat under nitrogen atmosphere to 550°C for one hour and then cooled under nitrogen to remove polymers, leaving behind carbon black, silica and zinc oxide and 650°C to eliminate carbon blacks, leaving only silica and zinc oxide.

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