Ion-Focusing System

Author(s):  
Thomas Robert
Keyword(s):  
1970 ◽  
Vol 42 (3) ◽  
pp. 425-425
Author(s):  
H. Y. Gee ◽  
M. W. Nathans
Keyword(s):  

Talanta ◽  
2011 ◽  
Vol 85 (4) ◽  
pp. 1792-1797 ◽  
Author(s):  
Yuri N. Kolomiets ◽  
Viktor V. Pervukhin

2012 ◽  
Vol 17 (4) ◽  
pp. 431-447 ◽  
Author(s):  
Oleksiy V. Klymenko ◽  
Christian Amatore ◽  
Wen Sun ◽  
Yong-Liang Zhou ◽  
Zhao-Wu Tian ◽  
...  

In this work we describe the theory and 2D simulation of ion separation and focusing in a new concept of microfluidic separation device. The principle of the method of ion focusing is classical in the sense that it consists in opposing a hydrodynamic transport ensured by the solution flow to an electrophoretic driving force so that any ionic sample results poised within the microchannel at the point where the two forces equilibrate. The originality of the concept investigated here relies on the fact that thanks to the use of an ion-conducting membrane of variable thickness in electrical contact with the channel the electrophoretic force is varied continuously all along the channel length. Similarly, changing the geometric shape of the membrane allows a facile optimization of the device separation and focusing properties.


2018 ◽  
Vol 36 (4) ◽  
pp. 470-476 ◽  
Author(s):  
X.P. Zhu ◽  
Q. Zhang ◽  
L. Ding ◽  
C.C. Zhang ◽  
Yu. Isakova ◽  
...  

AbstractThe paper presents the results of a study on propagation and focusing of high-intensity pulsed ion beams, produced by a self-magnetically insulated diode of semi-cylindrical geometry at the TEMP-6 accelerator (120 ns, 200–250 kV). We examined the space-charge neutralization of the beam, the energy density in the focus, the divergence of the beam, and its shot-to-shot displacement in the focal plane. It is found that the concentration of low-energy electrons in the beam is 1.3–1.5 times higher than the concentration of ions. We observed additional ion focusing by its own space charge. With an increase in the density of the net negative (electrons and ions) charge of the beam from 3.6 to 9 µC/cm2, the total divergence (the sum of the beam divergence in the vertical and horizontal planes) decreases from 11.4 to 4.5°. It leads to an increase in the energy density in the focus from 4 up to 10–12 J/cm2. To increase the electrons concentration in the beam, a metal grid installed in the ion beam transport region was used.


2007 ◽  
Vol 79 (10) ◽  
pp. 3779-3785 ◽  
Author(s):  
Gareth S. Dobson ◽  
Christie G. Enke

2008 ◽  
Vol 1 (1) ◽  
pp. 51-60 ◽  
Author(s):  
Alex W. Colburn ◽  
M.P. Barrow ◽  
M.C. Gill ◽  
A.E. Giannakopulos ◽  
Peter J. Derrick

1993 ◽  
Vol 5 (6) ◽  
pp. 1888-1901 ◽  
Author(s):  
Martin Lampe ◽  
Glenn Joyce ◽  
Steven P. Slinker ◽  
David H. Whittum

2006 ◽  
Vol 99 (7) ◽  
pp. 073301 ◽  
Author(s):  
S. N. Srivastava ◽  
K. Rohr ◽  
B. K. Sinha

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