Near Edge XRay Absorption Spectroscopy a Novel Approach for Determining Conduction Band Edge States in Transition Metal Oxide Gate Dielectrics

2005 ◽  
pp. 335
Author(s):  
G. Lucovsky ◽  
Y. Zhang ◽  
J. L. Whitten ◽  
D. G. Schlom ◽  
J. L. Freeouf
2016 ◽  
Vol 4 (3) ◽  
pp. 781-784 ◽  
Author(s):  
Yansong Zhou ◽  
Gang Chen ◽  
Yaoguang Yu ◽  
Chunshuang Yan ◽  
Jingxue Sun ◽  
...  

This work describes an ultra-facile and generalized route to synthesize transition metal oxide nanosheets including TiO2, Fe2O3, Co3O4, ZnO, and WO3with large area.


1997 ◽  
Vol 493 ◽  
Author(s):  
J Robertson ◽  
C W Chen

ABSTRACTThe electronic structure of SrBi2Ta2O9 and related oxides such as SrBi2Nb2O9, Bi2WO6 and Bi3Ti4O12 have been calculated by the tight-binding method. In each case, the band gap is about 4.1 eV and the band edge states occur on the Bi-O layers and consist of mixed O p/Bi s states at the top of the valence band and Bi p states at the bottom of the conduction band. The main difference between the compounds is that Nb 5d and Ti 4d states in the Nb and Ti compounds lie lower than the Ta 6d states in the conduction band. The surface pinning levels are found to pin Schottky barriers 0.8 eV below the conduction band edge.


2011 ◽  
Vol 13 (37) ◽  
pp. 16644 ◽  
Author(s):  
Maytal Caspary Toroker ◽  
Dalal K. Kanan ◽  
Nima Alidoust ◽  
Leah Y. Isseroff ◽  
Peilin Liao ◽  
...  

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