scholarly journals Advanced Characterization of Material Properties on the Nanometer Scale Using Atomic Force Microscopy

2012 ◽  
Vol 121 (2) ◽  
pp. 416-419 ◽  
Author(s):  
M.A. Fenner ◽  
S. Wu ◽  
J.J. Yu ◽  
H.P. Huber ◽  
F. Kienberger
Keyword(s):  
Atomic Force Microscopy ◽  
Material Properties ◽  
Advanced Characterization ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy

2001 ◽  
Vol 78 (26) ◽  
pp. 4181-4183 ◽  
Author(s):  
M. Porti ◽  
M. Nafrı́a ◽  
X. Aymerich ◽  
A. Olbrich ◽  
B. Ebersberger
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanometer Scale ◽  
Sio2 Films ◽  
Force Microscopy ◽  
Atomic Force

Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3830-3833 ◽  
Author(s):  
Takeshi Fukuma ◽  
Kei Kobayashi ◽  
Toshihisa Horiuchi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Polymer Thin Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Ferroelectric Polymer ◽  
Atomic Force ◽  
Scale Characterization

Atomic Force Microscopy Based Electric Modes in Characterization of Organic Photovoltaics

2013 ◽  
Vol 1500 ◽  
Author(s):  
Craig Wall ◽  
Sergei Magonov ◽  
Sergey Belikov ◽  
John Alexander
Keyword(s):  
Atomic Force Microscopy ◽  
Organic Photovoltaics ◽  
Nanometer Scale ◽  
Structure Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Combined Use ◽  
Structure Property Relationship ◽  
Electric Force Microscopy

ABSTRACTCapabilities of Atomic Force Microscopy in different modes including Electric Force Microscopy and Kelvin Force Microscopy are reviewed and illustrated on several samples including organic photovoltaics (P3HT/PCBM, PEDOT:PSS). Compositional mapping of these blends is enhanced with a combined use of the modes, and variations of local electric properties are detected down to the nanometer scale. The revealed morphology will assist in development of comprehensive models accounting for the structure-property relationship in solar cells and related devices.

Nanometer scale characterization of polymer films by atomic-force microscopy

2002 ◽  
Vol 181 (1) ◽  
pp. 457-466 ◽  
Author(s):  
Christian Teichert ◽  
Alfred Haas ◽  
Gernot M. Wallner ◽  
Reinhold W. Lang
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scale Characterization

Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

2021 ◽  
Author(s):  
Willian Silva Conceição ◽  
Ştefan Ţălu ◽  
Robert Saraiva Matos ◽  
Glenda Quaresma Ramos ◽  
Fidel Guereiro Zayas ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amazon Rainforest ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dinizia Excelsa
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