Atomic Force Microscopy Based Electric Modes in Characterization of Organic Photovoltaics

2013 ◽  
Vol 1500 ◽  
Author(s):  
Craig Wall ◽  
Sergei Magonov ◽  
Sergey Belikov ◽  
John Alexander
Keyword(s):  
Atomic Force Microscopy ◽  
Organic Photovoltaics ◽  
Nanometer Scale ◽  
Structure Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Combined Use ◽  
Structure Property Relationship ◽  
Electric Force Microscopy

ABSTRACTCapabilities of Atomic Force Microscopy in different modes including Electric Force Microscopy and Kelvin Force Microscopy are reviewed and illustrated on several samples including organic photovoltaics (P3HT/PCBM, PEDOT:PSS). Compositional mapping of these blends is enhanced with a combined use of the modes, and variations of local electric properties are detected down to the nanometer scale. The revealed morphology will assist in development of comprehensive models accounting for the structure-property relationship in solar cells and related devices.

scholarly journals Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy

2001 ◽  
Vol 78 (26) ◽  
pp. 4181-4183 ◽  
Author(s):  
M. Porti ◽  
M. Nafrı́a ◽  
X. Aymerich ◽  
A. Olbrich ◽  
B. Ebersberger
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanometer Scale ◽  
Sio2 Films ◽  
Force Microscopy ◽  
Atomic Force

Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3830-3833 ◽  
Author(s):  
Takeshi Fukuma ◽  
Kei Kobayashi ◽  
Toshihisa Horiuchi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Polymer Thin Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Ferroelectric Polymer ◽  
Atomic Force ◽  
Scale Characterization

The Application of Atomic Force Microscopy to the Characterization of Industrial Polymer Materials

MRS Bulletin ◽  
2004 ◽  
Vol 29 (7) ◽  
pp. 464-470 ◽  
Author(s):  
Georg K. Bar ◽  
Gregory F. Meyers
Keyword(s):  
Atomic Force Microscopy ◽  
Polymeric Materials ◽  
Porous Polymer ◽  
Polymer Materials ◽  
Phase Imaging ◽  
Structure Property ◽  
Polymer Systems ◽  
Force Microscopy ◽  
Atomic Force

AbstractAtomic force microscopy (AFM) is now well established among the tools of choice for the analysis and characterization of materials.Applications of AFM span many industries including chemicals, plastics, pharmaceuticals, and semiconductors.Advancements in AFM instrumentation over the last five years have expanded the range of application of this technology to investigate thermal and mechanical properties of complex materials at high spatial resolution as well as structural and morphological characterization of materials subjected to thermal and mechanical stresses.In particular, this has been an enabling technology for an improved understanding of structure–property relationships in polymeric materials including homopolymers, blends, impact-modified polymer systems, porous polymer systems, and semicrystalline polymers.Practical examples illustrate applications of contact, tapping-mode, phase-imaging, hot-stage, and scanning thermal methods for the characterization of modern industrial polymer materials.

Nanometer scale characterization of polymer films by atomic-force microscopy

2002 ◽  
Vol 181 (1) ◽  
pp. 457-466 ◽  
Author(s):  
Christian Teichert ◽  
Alfred Haas ◽  
Gernot M. Wallner ◽  
Reinhold W. Lang
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scale Characterization

scholarly journals Review—Multiscale Characterization of Li-Ion Batteries through the Combined Use of Atomic Force Microscopy and X-ray Microscopy and Considerations for a Correlative Analysis of the Reviewed Data

2021 ◽  
Author(s):  
Danilo Dini ◽  
Flavio Cognigni ◽  
Daniele Passeri ◽  
Francesca Anna Scaramuzzo ◽  
Mauro Pasquali ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
X Ray ◽  
Force Microscopy ◽  
Correlative Analysis ◽  
Atomic Force ◽  
Combined Use ◽  
Complementary Techniques ◽  
Non Destructive

Abstract The present review analyses the recent literature on the combined use of X-ray microscopy (XRM) and atomic force microscopy (AFM) for multiscale characterization of Li+ (or Li) batteries (LiBs) with the aim of developing guidelines for correlative analysis. The usefulness of XRM resides in the capability of affording non invasively in situ images of the inner parts of a LiB (an encapsulated device) with spatial resolution of dozens of nm during operation. XRM is non destructive and affords the early diagnosis of LiBs degradation causes when these manifest themselves as microdeformations. Multiscale characterization of LiBs also requires AFM for visualizing the morphological/physical alterations of LiB components (anodes, cathodes, electrolyte) at the sub-nanometer level. Different to XRM, AFM necessitates of a modification of LiB working configuration since AFM uses a contacting probe whereas XRM exploits radiation-matter interactions and does not require LiB dissection. A description of the working principles of the two techniques is provided to evidence which technical aspects have to be considered for achieving a meaningful correlative analysis of LiBs. In delineating new perspectives for the analysis of LiBs we will consider additional complementary techniques. Among various AFM-based techniques particular emphasis is given to electrochemical AFM (EC-AFM).

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