J2240305 Effect of stress ratio on fatigue damage accumulation process in single crystalline silicon
2014 ◽
Vol 2014
(0)
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pp. _J2240305--_J2240305-
2016 ◽
Vol 244
◽
pp. 314-323
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2004 ◽
Vol 41
(3)
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pp. 477-487
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2022 ◽
Keyword(s):
2014 ◽
Vol 2014.6
(0)
◽
pp. _20pm3-PM0-_20pm3-PM0
Keyword(s):
1997 ◽
Vol 144
(4)
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pp. 1495-1504
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Recombination Characteristics of Single-Crystalline Silicon Wafers with a Damaged Near-Surface Layer
2013 ◽
Vol 58
(2)
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pp. 142-150
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Keyword(s):
2020 ◽
Vol 86
(10)
◽
pp. 46-55