K-0111 Effect of Crystal Orientation and Structure on Mechanical Properties of Laminated Metallic Thin Films by using Molecular Dynamics

2001 ◽  
Vol V.01.1 (0) ◽  
pp. 21-22
Author(s):  
Haruo NAKAMURA ◽  
Sonoko MAEDA ◽  
Yasuhiro SAKURAI ◽  
Hideo KOBAYASHI
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Molecular Dynamics ◽  
Crystal Orientation ◽  
Metallic Thin Films

MD Analysis on Effect of Crystal Orientation on Mechanical Properties of Laminated Metallic Thin Films

2000 ◽  
Vol 2000.13 (0) ◽  
pp. 641-642
Author(s):  
Haruo NAKAMURA ◽  
Yasuhiro SAKURAI ◽  
Takashi SHIMOKUBO ◽  
Hideo KOBAYASHI
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Crystal Orientation ◽  
Metallic Thin Films

Deposition energy dependence in cluster-assembled thin film densities

2005 ◽  
Vol 908 ◽  
Author(s):  
Kristoffer Meinander ◽  
Tina Clauss ◽  
Kai Nordlund
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Mechanical Properties ◽  
Molecular Dynamics ◽  
Energy Dependence ◽  
Computer Simulations ◽  
Cluster Atom ◽  
Cu Nanoclusters ◽  
Deposition Energy

AbstractMechanical properties of thin films grown by nanocluster deposition are highly dependent on the energy at which the clusters are deposited. Using molecular dynamics computer simulations we have quantitatively studied variations in the properties of copper thin films grown by deposition of Cu nanoclusters, at energies ranging from 5 meV to 10 eV per cluster atom, on a Cu (100) substrate.

Elastic Properties of Artificially Layered Thin Films

1987 ◽  
Vol 103 ◽  
Author(s):  
Robert C. Cammarata
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Composite Materials ◽  
Elastic Properties ◽  
Elastic Moduli ◽  
Metallic Thin Films ◽  
Theoretical Understanding ◽  
Composition Modulation

ABSTRACTEnhancements in the elastic moduli by factors of two or more in compositionally modulated metallic thin films have been observed for a certain range of composition modulation wavelengths. The experimental and theoretical understanding of this phenomenon, known as the supermodulus effect, is reviewed. Also, the mechanical properties of other artificially layered and composite materials are discussed and compared with the behavior of metallic superlattice thin films.

Nanoscratching of Metallic Thin Films on Silicon Substrate: a Molecular Dynamics Study

2007 ◽  
Vol 36 (9) ◽  
pp. 1174-1180
Author(s):  
Tomoaki Akabane ◽  
Yasushi Sasajima ◽  
Jin Onuki
Keyword(s):  
Thin Films ◽  
Molecular Dynamics ◽  
Silicon Substrate ◽  
Metallic Thin Films

Nanocrystalline Electroplated Cu-Ni: Metallic Thin Films with Enhanced Mechanical Properties and Tunable Magnetic Behavior

2010 ◽  
Vol 20 (6) ◽  
pp. 983-991 ◽  
Author(s):  
Eva Pellicer ◽  
Aïda Varea ◽  
Salvador Pané ◽  
Bradley J. Nelson ◽  
Enric Menéndez ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Magnetic Behavior ◽  
Metallic Thin Films

Mechanical properties of metallic thin films: theoretical approach

2016 ◽  
Vol 89 (3) ◽  
Author(s):  
Duong Dai Phuong ◽  
Nguyen Thi Hoa ◽  
Vu Van Hung ◽  
Doan Quoc Khoa ◽  
Ho Khac Hieu
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Theoretical Approach ◽  
Metallic Thin Films

Assessment of mechanical properties of metallic thin-films through micro-beam testing

2014 ◽  
Vol 571 ◽  
pp. 296-301 ◽  
Author(s):  
M. Trueba ◽  
D. Gonzalez ◽  
M.R. Elizalde ◽  
J.M. Martínez-Esnaola ◽  
M.T. Hernandez ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Metallic Thin Films

Influence of the structure on the mechanical properties of electrodeposited metallic thin films

1993 ◽  
Vol 308 ◽  
Author(s):  
J.-L. Delplancke ◽  
R. Winand ◽  
J. Dille ◽  
J. Charlier
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Crystal Growth ◽  
Work Hardening ◽  
Room Temperature ◽  
Ageing Process ◽  
Metallic Thin Films ◽  
X Ray Diffraction ◽  
Stress Strain ◽  
X Ray

ABSTRACTProduction of thin (10 to 200 microns thick) metallic (Cu, Co and Ni-P) foils is performed by electrodeposition on various substrates. A competition between substrate-induced and electroplating-induced inhibition of crystal growth appears. Film structures observed by SEM, TEM and X-Ray diffraction are related to the mechanical properties of the films (stress-strain curves, microhardness and work hardening bend test).In some cases, copper thin films with a large number of submicron crystals are obtained. These films recrystallize at room temperature and their mechanical properties are completely modified by this ageing process.

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