Polarized light-scattering matrix elements for select perfect and perturbed optical surfaces

1987 ◽  
Vol 26 (12) ◽  
pp. 2410 ◽  
Author(s):  
Vincent J. Iafelice ◽  
William S. Bickel
Keyword(s):  
Light Scattering ◽  
Polarized Light ◽  
Scattering Matrix ◽  
Matrix Elements ◽  
Optical Surfaces ◽  
Scattering Matrix Elements

Polarized light scattering matrix elements for micron-sized rectangular aluminum lines on reflecting optical surfaces

1987 ◽  
Vol 26 (9) ◽  
pp. 1799 ◽  
Author(s):  
Vincent J. lafelice ◽  
William S. Bickel
Keyword(s):  
Light Scattering ◽  
Polarized Light ◽  
Scattering Matrix ◽  
Matrix Elements ◽  
Optical Surfaces ◽  
Scattering Matrix Elements

scholarly journals Laboratory evaluation of the scattering matrix of ragweed, ash, birch and pine pollens towards pollen classification

2021 ◽  
Author(s):  
Danaël Cholleton ◽  
Émilie Bialic ◽  
Antoine Dumas ◽  
Pascal Kaluzny ◽  
Patrick Rairoux ◽  
...  
Keyword(s):  
Light Scattering ◽  
Principal Component ◽  
Ambient Air ◽  
Scattering Matrix ◽  
Laboratory Evaluation ◽  
Matrix Formalism ◽  
Matrix Elements ◽  
Atmospheric Pollen ◽  
Earth’S Climate ◽  
Scattering Matrix Elements

Abstract. Pollens are nowadays recognized as one of the main atmospheric particles affecting public human health as well as the Earth's climate. In this context, an important issue concerns our ability to detect and differentiate among the existing pollen taxa. In this paper, the potential differences that may exist in light scattering by four of the most common pollen taxa, namely ragweed, birch, pine and ash, are analysed in the framework of the scattering matrix formalism at two wavelengths simultaneously (532 and 1064 nm). Interestingly, our laboratory experimental error bars are precise enough to show that these four pollens, when embedded in ambient air, exhibit different spectral and polarimetric light scattering characteristics, in the form of ten scattering matrix elements (five per wavelength), which allow identifying each separately. To end with, a simpler light scattering criterion is proposed for classifying among the four considered pollens by performing a principal component (PC) analysis, that still accounts for more than 99 % of the observed variance. We thus believe this work may open new insights for future atmospheric pollen detection.

scholarly journals A light-scattering study of the scattering matrix elements of Arizona Road Dust

2015 ◽  
Vol 163 ◽  
pp. 72-79 ◽  
Author(s):  
Yuli Wang ◽  
Amitabha Chakrabarti ◽  
Christopher M. Sorensen
Keyword(s):  
Light Scattering ◽  
Road Dust ◽  
Scattering Matrix ◽  
Matrix Elements ◽  
Scattering Study ◽  
Scattering Matrix Elements

The light-scattering Mueller matrices for Rayleigh and Rayleigh-Gans-Debye approximation

1990 ◽  
Vol 55 (12) ◽  
pp. 2889-2897
Author(s):  
Jaroslav Holoubek
Keyword(s):  
Light Scattering ◽  
Theoretical Work ◽  
Matrix Elements ◽  
Elastic Light Scattering ◽  
Yield Information ◽  
Recent Theoretical Work ◽  
Particle Parameters ◽  
Complete Set ◽  
Single Matrix ◽  
Scattering Matrix Elements

Recent theoretical work has shown that the complete set of polarized elastic light-scattering studies should yield information about scatterer structure that has so far hardly been utilized. We present here calculations of angular dependences of light-scattering matrix elements for spheres near the Rayleigh and Rayleigh-Gans-Debye limits. The significance of single matrix elements is documented on examples that show how different matrix elements respond to changes in particle parameters. It appears that in the small-particle limit (Rg/λ < 0.1) we do not loose much information by ignoring "large particle" observables.

scholarly journals Anisotropic dielectric susceptibility matrix of anisotropic medium

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Wanrong Gao
Keyword(s):  
Light Scattering ◽  
Anisotropic Medium ◽  
Polarized Light ◽  
Scattering Matrix ◽  
Dielectric Susceptibility ◽  
Anisotropic Dielectric ◽  
New Methods ◽  
Mueller Matrices ◽  
Anisotropic Structures ◽  
The Fourier Transform

AbstractIn this work, we introduce the concept of anisotropic dielectric susceptibility matrix of anisotropic medium for both nondepolarizing and depolarizing medium. The concept provides a new way of analyzing light scattering properties of anisotropic media illuminated by polarized light. The explicit expressions for the elements of the scattering matrix are given in terms of the elements of the Fourier transform of the anisotropic dielectric susceptibility matrix of the medium. Finally, expressions for the elements of the Jones matrix of a thin layer of a deterministic anisotropic medium and the elements of the Mueller matrix of a depolarizing medium are given. The results obtained in this work is helpful for deriving information about the correlated anisotropic structures in depolarizing media from measured Mueller matrices. The findings in this work may also well prove stimulating to researchers working on new methods for analyzing light scattering properties.

scholarly journals Importance of individual scattering matrix elements at Fano resonances

2006 ◽  
Vol 18 (23) ◽  
pp. 5313-5321
Author(s):  
P Singha Deo ◽  
M Manninen
Keyword(s):  
Scattering Matrix ◽  
Matrix Elements ◽  
Fano Resonances ◽  
Scattering Matrix Elements
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