Aberration properties and performance of a new diffractive-gradient-index high-resolution objective

2001 ◽  
Vol 40 (16) ◽  
pp. 2730 ◽  
Author(s):  
Grigoriy I. Greisukh ◽  
Evgeniy G. Ezhov ◽  
Sergei A. Stepanov
Keyword(s):  
High Resolution ◽  
Gradient Index ◽  
And Performance

scholarly journals Fabrication and Compressive Behavior of a Micro-Lattice Composite by High Resolution DLP Stereolithography

Polymers ◽  
2021 ◽  
Vol 13 (5) ◽  
pp. 785
Author(s):  
Chow Shing Shin ◽  
Yu Chia Chang
Keyword(s):  
High Resolution ◽  
Lattice Structure ◽  
Low Cost ◽  
Hierarchical Structures ◽  
Dip Coating ◽  
Unit Cell ◽  
Digital Light Processing ◽  
Unit Cell Size ◽  
Wide Range ◽  
And Performance

Lattice structures are superior to stochastic foams in mechanical properties and are finding increasing applications. Their properties can be tailored in a wide range through adjusting the design and dimensions of the unit cell, changing the constituent materials as well as forming into hierarchical structures. In order to achieve more levels of hierarchy, the dimensions of the fundamental lattice have to be small enough. Although lattice size of several microns can be fabricated using the two-photon polymerization technique, sophisticated and costly equipment is required. To balance cost and performance, a low-cost high resolution micro-stereolithographic system has been developed in this work based on a commercial digital light processing (DLP) projector. Unit cell lengths as small as 100 μm have been successfully fabricated. Decreasing the unit cell size from 150 to 100 μm increased the compressive stiffness by 26%. Different pretreatments to facilitate the electroless plating of nickel on the lattice structure have been attempted. A pretreatment of dip coating in a graphene suspension is the most successful and increased the strength and stiffness by 5.3 and 3.6 times, respectively. Even a very light and incomplete nickel plating in the interior has increase the structural stiffness and strength by more than twofold.

scholarly journals A High Resolution Spectrograph at Weihai Observatory

2012 ◽  
Vol 8 (S293) ◽  
pp. 400-402
Author(s):  
Dongyang Gao ◽  
Dayong Ren
Keyword(s):  
High Resolution ◽  
Echelle Spectrograph ◽  
Metal Abundance ◽  
And Performance

AbstractWeihai Echelle Spectrograph (WES) is the first the fiber-fed echelle spectrograph in China. WES can provide data for the studies of metal abundance of stars, exoplanets researches and asteroseismology, etc. A brief description of its design and performance is given.

High resolution Michelson interferometer for airborne infrared astronomical observations 1: Concept and performance

1977 ◽  
Vol 16 (7) ◽  
pp. 1834 ◽  
Author(s):  
J. P. Baluteau ◽  
M. Anderegg ◽  
A. F. M. Moorwood ◽  
N. Coron ◽  
J. E. Beckman ◽  
...  
Keyword(s):  
High Resolution ◽  
Michelson Interferometer ◽  
Astronomical Observations ◽  
And Performance

Design and performance of an ultra-high-resolution 300 kV microscope

1996 ◽  
Vol 64 (1-4) ◽  
pp. 17-34 ◽  
Author(s):  
Hans Bakker ◽  
Arno Bleeker ◽  
Peter Mul
Keyword(s):  
High Resolution ◽  
And Performance

scholarly journals MRA-SNet: Siamese Networks of Multiscale Residual and Attention for Change Detection in High-Resolution Remote Sensing Images

2021 ◽  
Vol 13 (22) ◽  
pp. 4528
Author(s):  
Xin Yang ◽  
Lei Hu ◽  
Yongmei Zhang ◽  
Yunqing Li
Keyword(s):  
Remote Sensing ◽  
High Resolution ◽  
Change Detection ◽  
Remote Sensing Image ◽  
Image Features ◽  
Remote Sensing Images ◽  
The Rich ◽  
The Difference ◽  
Basic Network ◽  
And Performance

Remote sensing image change detection (CD) is an important task in remote sensing image analysis and is essential for an accurate understanding of changes in the Earth’s surface. The technology of deep learning (DL) is becoming increasingly popular in solving CD tasks for remote sensing images. Most existing CD methods based on DL tend to use ordinary convolutional blocks to extract and compare remote sensing image features, which cannot fully extract the rich features of high-resolution (HR) remote sensing images. In addition, most of the existing methods lack robustness to pseudochange information processing. To overcome the above problems, in this article, we propose a new method, namely MRA-SNet, for CD in remote sensing images. Utilizing the UNet network as the basic network, the method uses the Siamese network to extract the features of bitemporal images in the encoder separately and perform the difference connection to better generate difference maps. Meanwhile, we replace the ordinary convolution blocks with Multi-Res blocks to extract spatial and spectral features of different scales in remote sensing images. Residual connections are used to extract additional detailed features. To better highlight the change region features and suppress the irrelevant region features, we introduced the Attention Gates module before the skip connection between the encoder and the decoder. Experimental results on a public dataset of remote sensing image CD show that our proposed method outperforms other state-of-the-art (SOTA) CD methods in terms of evaluation metrics and performance.

A New ion Beam Based Etching/Coating System for Scanning Electron Microscopy (SEM) and Light Microscopy (LM)

1997 ◽  
Vol 3 (S2) ◽  
pp. 363-364
Author(s):  
R. Alani ◽  
R.J. Mitro ◽  
C.M. Tabatt ◽  
L. Malaszewski
Keyword(s):  
High Resolution ◽  
Ion Beam ◽  
Coating System ◽  
Etching Technique ◽  
Specimen Handling ◽  
Conductive Films ◽  
Resolution Electron ◽  
New Instrument ◽  
Electron Microscopes ◽  
And Performance

The design and performance of a new instrument, based on improved Penning ion guns [1] for etching and coating samples for SEM and LM in a single vacuum chamber, are described. The instrument is based on an existing high resolution ion beam coating system, which is capable of producing high quality ultra-thin and amorphous conductive films, required for present high resolution electron microscopes. [2]. The fact that in this system both etching and coating processes are combined in one chamber, the specimen handling and specimen contamination are minimized. Furthermore, the system eliminates the traditional multiple mounting /dismounting of samples to various holders for mechanical polishing, etching, coating and microscopy purposes. The specimen can stay with the same holder throughout the entire process, increasing the sample through-put. Moreover, the system offers an alternative method to the traditional “wet chemical etching,” technique with its well known problems.

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