Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy
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2010 ◽
Vol 87
(5-8)
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pp. 1540-1542
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2020 ◽
Vol 3
(2)
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pp. 1250-1262
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2007 ◽
Vol 78
(5)
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pp. 053712
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