Errors in ellipsometry measurements made with a photoelastic modulator

1983 ◽  
Vol 73 (7) ◽  
pp. 892 ◽  
Author(s):  
F. A. Modine ◽  
G. E. Jellison ◽  
G. R. Gruzalski
Keyword(s):  
Photoelastic Modulator

scholarly journals Fast and full range measurements of ellipsometric parameters using a 45° dual-drive symmetric photoelastic modulator

2017 ◽  
Vol 25 (5) ◽  
pp. 5725 ◽  
Author(s):  
Li Kewu ◽  
Zhang Rui ◽  
Jing Ning ◽  
Chen Youhua ◽  
Zhang Minjuan ◽  
...  
Keyword(s):  
Full Range ◽  
Range Measurements ◽  
Photoelastic Modulator

Calibrations of Phase Modulation Amplitude of Photoelastic Modulator

2004 ◽  
Vol 43 (2) ◽  
pp. 827-832 ◽  
Author(s):  
Meng-Wei Wang ◽  
Yu-Faye Chao ◽  
Keh-Chyang Leou ◽  
Fei-Hsin Tsai ◽  
Tsang-Lang Lin ◽  
...  
Keyword(s):  
Phase Modulation ◽  
Modulation Amplitude ◽  
Photoelastic Modulator

Off-resonance properties of a photoelastic modulator

2005 ◽  
Author(s):  
Karlton Crabtree ◽  
Neil Beaudry ◽  
Russell Chipman
Keyword(s):  
Photoelastic Modulator ◽  
Resonance Properties

Calibration method for a photoelastic modulator with a peak retardation of less than a half-wavelength

2007 ◽  
Vol 46 (5) ◽  
pp. 699 ◽  
Author(s):  
Aijun Zeng ◽  
Lihua Huang ◽  
Zuoren Dong ◽  
Jianming Hu ◽  
Huijie Huang ◽  
...  
Keyword(s):  
Calibration Method ◽  
Photoelastic Modulator ◽  
Half Wavelength

Photoelastic-modulator-based differential frequency polarization modulation measurement and error analysis

2013 ◽  
Vol 21 (4) ◽  
pp. 876-883 ◽  
Author(s):  
王志斌 WANG Zhi-bin ◽  
张瑞 ZHANG Rui ◽  
赵冬娥 ZHAO Dong-e ◽  
陈友华 CHEN You-hua ◽  
魏海潮 WEI Hai-chao
Keyword(s):  
Error Analysis ◽  
Polarization Modulation ◽  
Photoelastic Modulator

Polarization Modulation Fourier Transform Infrared Ellipsometry of Thin Polymer Films

1986 ◽  
Vol 40 (4) ◽  
pp. 498-503 ◽  
Author(s):  
R. T. Graf ◽  
F. Eng ◽  
J. L. Koenig ◽  
H. Ishida
Keyword(s):  
Optical Constants ◽  
Relative Phase ◽  
Polarization Modulation ◽  
Thin Polymer Films ◽  
Phase Retardation ◽  
Photoelastic Modulator ◽  
Infrared Ellipsometry ◽  
Thin Polymer ◽  
Gold Substrates ◽  
Ft Ir

Polarization modulation infrared ellipsometric spectra were collected on an FT-IR spectrometer, with the use of two linear polarizers and a photoelastic modulator. Samples consisted of thin poly(vinyl acetate) and poly(methyl methacrylate) films on gold substrates. The relative phase retardation (delta) and relative amplitude (psi) were derived from these measurements. These spectra were superior to those from static infrared ellipsometry measurements on the same samples. The thickness and optical constants of the films were calculated from the ellipsometric measurements and compared with reference optical constant spectra.

Sign in / Sign up

Export Citation Format

Share Document