Polarization Modulation Fourier Transform Infrared Ellipsometry of Thin Polymer Films

1986 ◽  
Vol 40 (4) ◽  
pp. 498-503 ◽  
Author(s):  
R. T. Graf ◽  
F. Eng ◽  
J. L. Koenig ◽  
H. Ishida
Keyword(s):  
Optical Constants ◽  
Relative Phase ◽  
Polarization Modulation ◽  
Thin Polymer Films ◽  
Phase Retardation ◽  
Photoelastic Modulator ◽  
Infrared Ellipsometry ◽  
Thin Polymer ◽  
Gold Substrates ◽  
Ft Ir

Polarization modulation infrared ellipsometric spectra were collected on an FT-IR spectrometer, with the use of two linear polarizers and a photoelastic modulator. Samples consisted of thin poly(vinyl acetate) and poly(methyl methacrylate) films on gold substrates. The relative phase retardation (delta) and relative amplitude (psi) were derived from these measurements. These spectra were superior to those from static infrared ellipsometry measurements on the same samples. The thickness and optical constants of the films were calculated from the ellipsometric measurements and compared with reference optical constant spectra.

Fourier transform infrared ellipsometry of thin polymer films

1986 ◽  
Vol 58 (1) ◽  
pp. 64-68 ◽  
Author(s):  
Robert T. Graf ◽  
Jack L. Koenig ◽  
Hatsuo. Ishida
Keyword(s):  
Fourier Transform ◽  
Polymer Films ◽  
Fourier Transform Infrared ◽  
Thin Polymer Films ◽  
Infrared Ellipsometry ◽  
Thin Polymer

Characterization of ultra-thin polymer films by polarization modulation FTIR spectroscopy

2001 ◽  
Vol 164 (1) ◽  
pp. 159-166
Author(s):  
Gerald Steiner ◽  
Olesya Savchuk ◽  
Hella Möller ◽  
Dirk Ferse ◽  
Hans-Jürgen Adler ◽  
...  
Keyword(s):  
Ftir Spectroscopy ◽  
Polymer Films ◽  
Polarization Modulation ◽  
Thin Polymer Films ◽  
Thin Polymer

scholarly journals An optical examination of thin films. I.—The optical constants of mercury

1934 ◽  
Vol 145 (854) ◽  
pp. 115-126 ◽  
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Optical Constants ◽  
Relative Phase ◽  
Reflection Coefficients ◽  
Angle Of Incidence ◽  
Clean Surface ◽  
Phase Retardation ◽  
Optical Examination ◽  
Approximate Equations

Drude originally suggested that the properties of films on both absorbing and non-absorbing substrates could be studied by an optical method, since the reflecting properties of a surface are modified by the presence of a film. This method has in part been used by various workers, with some success. For liquid surfaces, or for smooth surfaces of solids, such as are obtained by cleavage or after suitable polishing, it is possible to measure “the relative phase retardation,” Δ, and “the ratio of the reflection coefficients,” tan ψ, which define the reflecting properties. From the values of Δ and ψ for a clean surface, the refractive index, n , and the absorption coefficient, k , characteristic of the material can be found from the approximate equations n = sin ϕ tan ϕ cos 2ψ/(1 + cos Δ sin 2ψ), (1.1) k = sin Δ tan 2ψ, (2.1) where ϕ is the angle of incidence.

Infrared optical constants and dichroism of thin polymer films: Trans-polyacetylene

1987 ◽  
Vol 67 (4) ◽  
pp. 459-465 ◽  
Author(s):  
R. Uitz ◽  
G. Temmel ◽  
G. Leising ◽  
H. Kahlert
Keyword(s):  
Polymer Films ◽  
Optical Constants ◽  
Thin Polymer Films ◽  
Thin Polymer

Polarization-Modulation Emission FT-IR Measurement of Thin Organic Films on Metal Surfaces

1992 ◽  
Vol 46 (1) ◽  
pp. 156-158 ◽  
Author(s):  
Kenji Tochigi ◽  
Hideto Momose ◽  
Yutaka Misawa ◽  
Takaya Suzuki
Keyword(s):  
Metal Surfaces ◽  
Background Radiation ◽  
Infrared Emission ◽  
Organic Films ◽  
Polarization Modulation ◽  
Ir Spectrometry ◽  
Photoelastic Modulator ◽  
Thin Organic Films ◽  
Ft Ir ◽  
Large Background

A polarization-modulation technique has been combined with Fourier transform infrared (FT-IR) spectrometry to eliminate the large background radiation which interferes with the infrared emission from thin organic films on metal surfaces. A step scan and a continuous scan interferometer which were combined with a photoelastic modulator were also studied, and the step scan system was found to be stabler and have a better S/N. The spectrum of a 12-nm perfluoropolyether film was obtained at 120°C by this system.

Is the chain dynamics in thin polymer films isotropic ?

2000 ◽  
Vol 10 (PR7) ◽  
pp. Pr7-233-Pr7-237 ◽  
Author(s):  
S. Rivillon ◽  
P. Auroy ◽  
B. Deloche
Keyword(s):  
Polymer Films ◽  
Thin Polymer Films ◽  
Chain Dynamics ◽  
Thin Polymer

Surface Modification of Poly (alkyl/Arylphosphazene) Thin Films

2000 ◽  
Vol 629 ◽  
Author(s):  
John V. St. John ◽  
Patty Wisian-Neilson
Keyword(s):  
Thin Films ◽  
Surface Modification ◽  
Chemical Resistance ◽  
Chemical Properties ◽  
Inorganic Polymers ◽  
Thin Polymer Films ◽  
Hydrophilic Interactions ◽  
Carboxylic Acid Groups ◽  
Polymer Interface ◽  
Thin Polymer

ABSTRACTPoly (methylphenylphosphazene) (PMPP) is an example of a unique class of inorganic polymers with alternating – (P=N)– backbones. Chemical modification of bulk PMPP can result in changes of physical properties such as chemical resistance, onset temperature of thermal degradation, elasticity, and flexibility. Surface modification of PMPP allows tailoring of the chemical properties at the polymer interface while maintaining the integrity of the bulk polymer. In this research, PMPP thin films were treated to form carboxylate or carboxylic acid groups at the surface. Surface modification was monitored by following changes in contact angle. The hydrophobic/hydrophilic interactions of carboxylated PMPP surfaces allow for mesoscale interactions of thin polymer films.

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