Simultaneous film thickness and refractive index measurement using a constrained fitting method in white light spectral interferometer
Lin Yuan
◽
Tong Guo
◽
Dawei Tang
◽
Haitao Liu
◽
Xinyuan Guo
2010 ◽
Vol 49
(5)
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pp. 910
◽
Seung Hwan Kim
◽
Seoung Hun Lee
◽
Jae In Lim
◽
Kyong Hon Kim
T. Y. Chen
◽
Y. J. Lin
◽
S. G. Hu
◽
S. L. Yang
◽
J. C. Chung
2013 ◽
Vol 188
◽
pp. 1212-1217
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Carlos Gouveia
◽
Mohammad Zibaii
◽
Hamid Latifi
◽
Manuel J.B. Marques
◽
J.M. Baptista
◽
...
2010 ◽
Vol 30
(1)
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pp. 117-122
2012 ◽
Vol 23
(4)
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pp. 047001
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Wenping Guo
◽
Min Xia
◽
Wei Li
◽
Jie Dai
◽
Xiaohui Zhang
◽
...
Terry Yuan-Fang Chen
◽
Chien-Chih Chen
C. Gouveia
◽
M. Zibaii
◽
H. Latifi
◽
M. J. Marques
◽
J. M. Baptista
◽
...
2017 ◽
Vol 76
(8)
◽
pp. 731-742
Shui-e Shi
◽
Shuai-shuai Xu
◽
Xin Li
2021 ◽
Vol 78
(2)
◽
pp. 124-129
Han Wook Song
◽
Jong Ho Kim
◽
Sam Yong Woo