scholarly journals Exploring Durable Genetic Resistance against Leaf Rust through Phenotypic Characterization and Lr34Linked STS Marker in Wheat Germplasm

2016 ◽  
pp. 986-998 ◽  
Author(s):  
Qaisar Khan ◽  
Abdul Samad Mumtaz ◽  
Haris Khurshid ◽  
Sohail Ahmad Jan ◽  
Nazir Ahmad ◽  
...  
Keyword(s):  
Leaf Rust ◽  
Genetic Resistance ◽  
Phenotypic Characterization ◽  
Sts Marker ◽  
Wheat Germplasm

Puccinia triticina (wheat brown rust).

2021 ◽  
Author(s):  
Henriette Goyeau
Keyword(s):  
Leaf Rust ◽  
Yield Loss ◽  
Genetic Resistance ◽  
Puccinia Triticina ◽  
Multiple Point ◽  
Yield Losses ◽  
Flowering Stage ◽  
Crop Losses ◽  
Pathogen Virulence ◽  
Cropping Season

Abstract Leaf rust seldom kills wheat, but it is capable of causing 35-50% yield loss in endemic areas on susceptible cultivars, where severity levels of 25-40% are reached at the tillering stage and 100% at the flowering stage. The disease causes more damage worldwide than other wheat rusts. Quarantine is of no relevance as leaf rust is of worldwide occurrence and virulences spread freely between nations and zones. Crop losses are dependent on the genetic resistance of each cultivar, pathogen virulence and environmental conditions. Losses caused by leaf rust particularly originate from reductions of the wheat photosynthetic area. Infected plants normally produce a lower number of tillers, lower amounts of grains per head and smaller grains. The earlier the epidemic in the cropping season, the higher the yield losses. Mathematical models for estimating disease severity and crop losses have been developed based on multiple-point disease recording at different physiological stages of the plant (Burleigh et al., 1972; Eversmeyer and Kramer, 1998, 2000).

scholarly journals Resistance of European winter wheat germplasm to leaf rust

Agronomie ◽  
2000 ◽  
Vol 20 (7) ◽  
pp. 783-792 ◽  
Author(s):  
Michael Winzeler ◽  
Ákos Mesterházy ◽  
Robert F. Park
Keyword(s):  
Winter Wheat ◽  
Leaf Rust ◽  
Wheat Germplasm ◽  
European Winter Wheat

scholarly journals Field-based screening identifies resistance to Sunn pest (Eurygaster integriceps) feeding at vegetative stage in elite wheat genotypes

2017 ◽  
Vol 68 (2) ◽  
pp. 126 ◽  
Author(s):  
Livinus Emebiri ◽  
Mustapha El Bousshini ◽  
Mui-Keng Tan ◽  
Francis C. Ogbonnaya
Keyword(s):  
Strong Association ◽  
Genetic Resistance ◽  
Pest Resistance ◽  
Snp Markers ◽  
Vegetative Stage ◽  
Sunn Pest ◽  
Wheat Varieties ◽  
Wheat Germplasm ◽  
Eurygaster Integriceps ◽  
A Genome

Sunn pest (Eurygaster integriceps Puton) is currently widely distributed in West and Central Asia and Eastern Europe, but has not been found in Australia, Western Europe or North America. Climate warming is known to promote the expansion of its range of distribution, and it is expected that the insect could spread into new territories. Varieties of wheat (Triticum aestivum) carrying resistance remain an important component of managing the biosecurity risk of any potential incursion. Previous studies have identified sources of Sunn pest resistance in wheat, but there is little information on the genes that confer the resistance. This research used field-based, artificial infestation cages to evaluate 204 elite wheat varieties for Sunn pest resistance, at Terbol, Lebanon. A significant (P < 0.001) difference in resistance was observed among the wheat germplasm, with 19 varieties rated as resistant to moderately resistant and 17 as highly susceptible. Three of the elite varieties showed very little damage, a status similar to that of the resistant check, ICBW-209273. In parallel, the research carried out a genome-wide scan with single-nucleotide polymorphism (SNP) markers to identify chromosome regions and putative genes associated with resistance. Association mapping identified SNP markers with significant associations on chromosomes 2D, 4B and 5B. When these markers were projected onto the wheat population sequencing-based (POPSEQ) reference map, they tended to map close to the location of wheat height-reducing genes. The phenotypic variation explained by the identified markers ranged from 7% to 11%, and collectively, they explained 23.9% of the variation or 45% of the generalised heritability. Marker-trait association was confirmed in two independent, doubled-haploid wheat populations, derived from crosses involving wheat landraces from Afghanistan, where Sunn pest is recognised as an endemic problem. In the two wheat populations, the analyses validated the strong association between wsnp_BF483640B_Ta_2_2 and resistance to Sunn pest damage at the vegetative stage. This study demonstrates existence of genetic resistance to Sunn pest feeding at the vegetative stage in elite wheat germplasm. The study also identified and validated SNP markers that could be useful tools for transfer of resistance into new wheat cultivars.

scholarly journals Identification of leaf rust resistant gene Lr10 in Pakistani wheat germplasm

2013 ◽  
Vol 10 (43) ◽  
pp. 8578-8583
Author(s):  
Hussain Wajid ◽  
Inamullah ◽  
Ahmad Habib ◽  
Sajjad Iqbal Muhammad ◽  
Muhammad Abbassi Fida ◽  
...  
Keyword(s):  
Leaf Rust ◽  
Wheat Germplasm ◽  
Resistant Gene

Registration of Soft Wheat Germplasm AR93005 Resistant to Leaf Rust

Crop Science ◽  
2006 ◽  
Vol 46 (3) ◽  
pp. 1398-1399 ◽  
Author(s):  
Robert K. Bacon ◽  
John T. Kelly ◽  
Eugene A. Milus ◽  
Charles E. Parsons
Keyword(s):  
Leaf Rust ◽  
Soft Wheat ◽  
Wheat Germplasm

Identification of a STS marker linked to the Aegilops speltoides-derived leaf rust resistance gene Lr28 in wheat

1998 ◽  
Vol 97 (4) ◽  
pp. 535-540 ◽  
Author(s):  
S. Naik ◽  
K. S. Gill ◽  
V. S. Prakasa Rao ◽  
V. S. Gupta ◽  
S. A. Tamhankar ◽  
...  
Keyword(s):  
Leaf Rust ◽  
Resistance Gene ◽  
Rust Resistance ◽  
Leaf Rust Resistance ◽  
Rust Resistance Gene ◽  
Aegilops Speltoides ◽  
Leaf Rust Resistance Gene ◽  
Sts Marker

Comparison of the effect of leaf rust on the grain yield of resistant, partially resistant, and susceptible spring wheat cultivars

1991 ◽  
Vol 6 (3) ◽  
pp. 115-121 ◽  
Author(s):  
R. P. Singh ◽  
T. S. Payne ◽  
P. Figueroa ◽  
S. Valenzuela
Keyword(s):  
Grain Yield ◽  
Leaf Rust ◽  
Partial Resistance ◽  
Genetic Resistance ◽  
Kernel Weight ◽  
Test Weight ◽  
Slight Reduction ◽  
Hypersensitive Resistance ◽  
Rust Disease ◽  
Spring Bread Wheat

AbstractThree hypersensitive resistant, six partially resistant (slow rusting), and one susceptible spring bread wheat (Triticum aestivum L.) cultivars were evaluated for grain yield, test weight, and kernel weight under artificially created epiphytotics of leaf rust disease (caused by Puccinia recondita f. sp. tritici) with and without fungicide protection for three years. Rusted plot yields were 4 percent lower compared to fungicide-protected plot yields for cultivars with hypersensitive resistance. In rusted plots, grain yield and kernel weight averaged 8 percent less for cultivars with partial resistance but varied from 2 to 20 percent less depending on cultivar. The susceptible check cultivar, Yecora 70, averaged 27 percent lower grain yield, 22 percent lower kernel weight, and 6 percent lower test weight in rusted plots. Slight reduction in test weight was also observed for each cultivar. Losses in grain yield could, therefore, be reduced to levels similar to those of hypersensitive resistant cultivars by the use of partial resistance. We discuss the sustainability of partial genetic resistance to leaf rust. Since partial resistance is expected to be durable, and since rust levels and effects on yield in farmers' fields are likely to be less than in this experimental plot study, partial resistance should give long-lasting resistance at a negligible cost in yield that is insufficient to justify the use of fungicides.

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