Three-dimensional geologic modeling of a metamorphic complex for characterization of a deep underground research laboratory site

The Mizunami Underground Research Laboratory (MIU) Project, a comprehensive research project investigating the deep underground environment in crystalline rock, is being conducted by the Japan Atomic Energy Agency at Mizunami City, Central Japan. The MIU Project is being carried out in three overlapping phases: Surface-based Investigation (Phase I), Construction (Phase II), and Operation (Phase III), with a total duration of 20 years. The overall project goals of the MIU Project from Phase I through to Phase III are: 1) to establish techniques for investigation, analysis and assessment of the deep geological environment, and 2) to develop a range of engineering techniques for deep underground application. Phase I was completed in March 2004, and Phase II investigations associated with the construction of the underground facilities are currently underway. Phase II investigation goals are to evaluate the geological, hydrogeological, hydrogeochemical and rock mechanical models developed in Phase I and to assess changes in the deep geological environment caused by the construction of underground facilities. Geological mapping, borehole investigations for geological, hydrogeological, hydrochemical and rock mechanical studies are being carried out in shafts and research galleries in order to evaluate the models. Long-term monitoring of changes in groundwater chemistry and pressure associated with the construction of the underground facilities continue in and around the MIU site, using existing boreholes and monitoring systems. This report summarizes the current status of the MIU Project on results of the Phase II investigations to date.

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Characterization of photosystem II with the atomic-force microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100130365 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1146-1147

Author(s):

Kathleen M. Marr ◽

Mary K. Lyon

Keyword(s):

Photosystem Ii ◽

Atomic Force Microscope ◽

Three Dimensional ◽

Biologically Active ◽

Atomic Force ◽

Freeze Etching ◽

Image Averaging ◽

Oxygen Evolving ◽

Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

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convergent-beam diffraction from surfaces

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100125208 ◽

1987 ◽

Vol 45 ◽

pp. 30-33

Author(s):

J. A. Eades ◽

A. E. Smith ◽

D. F. Lynch

Keyword(s):

Reciprocal Lattice ◽

Three Dimensional ◽

Grazing Incidence ◽

Three Dimensions ◽

Plane Figure ◽

Transmission Electron ◽

Convergent Beam ◽

Beam Patterns ◽

Beam Diffraction

It is quite simple (in the transmission electron microscope) to obtain convergent-beam patterns from the surface of a bulk crystal. The beam is focussed onto the surface at near grazing incidence (figure 1) and if the surface is flat the appropriate pattern is obtained in the diffraction plane (figure 2). Such patterns are potentially valuable for the characterization of surfaces just as normal convergent-beam patterns are valuable for the characterization of crystals.There are, however, several important ways in which reflection diffraction from surfaces differs from the more familiar electron diffraction in transmission.GeometryIn reflection diffraction, because of the surface, it is not possible to describe the specimen as periodic in three dimensions, nor is it possible to associate diffraction with a conventional three-dimensional reciprocal lattice.

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Construction of plastic contact deformation maps on ceramics: a case study on aluminum nitride

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100165641 ◽

1996 ◽

Vol 54 ◽

pp. 636-637

Author(s):

D. L. Callahan

Keyword(s):

Plastic Deformation ◽

Aluminum Nitride ◽

Mechanical Response ◽

Three Dimensional ◽

Bright Field Image ◽

Perfectly Plastic ◽

Contrast Analysis ◽

Deformation Patterns

Modern polishing, precision machining and microindentation techniques allow the processing and mechanical characterization of ceramics at nanometric scales and within entirely plastic deformation regimes. The mechanical response of most ceramics to such highly constrained contact is not predictable from macroscopic properties and the microstructural deformation patterns have proven difficult to characterize by the application of any individual technique. In this study, TEM techniques of contrast analysis and CBED are combined with stereographic analysis to construct a three-dimensional microstructure deformation map of the surface of a perfectly plastic microindentation on macroscopically brittle aluminum nitride.The bright field image in Figure 1 shows a lg Vickers microindentation contained within a single AlN grain far from any boundaries. High densities of dislocations are evident, particularly near facet edges but are not individually resolvable. The prominent bend contours also indicate the severity of plastic deformation. Figure 2 is a selected area diffraction pattern covering the entire indentation area.

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