Cryo secondary ion mass spectrometry for wood component visualization: a mini review

Holzforschung ◽  
2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Dan Aoki ◽  
Yasuyuki Matsushita ◽  
Kazuhiko Fukushima
Keyword(s):  
Mass Spectrometry ◽  
Living Cell ◽  
Secondary Ion Mass Spectrometry ◽  
Imaging Mass Spectrometry ◽  
High Vacuum ◽  
Sample Surface ◽  
Detection Methods ◽  
Wood Component ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Abstract Various phenomena in living physiological systems are conducted on the hydrated conditions, and in many cases, they do not work in a dry state. Imaging mass spectrometry is one of the direct detection methods scanning the sample surface with some focused and pulsed energy and analysing the sputtered components. However, under the high vacuum conditions required for usual imaging mass spectrometry, the sample surface is rapidly dried. It is difficult for the target cell to survive, and the original situation are lost soon. Here, the combination of a freeze-fixation and a cryo sample stage is a promising method to do mass spectrometry while maintaining the original situation. By rapidly freezing the cells, the momentary situation as a living cell is fixed. The situation in a living cell can be captured as still images by cryo imaging mass spectrometry. This mini-review introduces the outline of imaging mass spectrometry especially for low molecular weight components and recent results for frozen-hydrated samples by cryo secondary ion mass spectrometry.

Improvement of biomolecular analysis in thin films using in-situ matrix enhanced Secondary Ion Mass Spectrometry

The Analyst ◽  
2021 ◽  
Author(s):  
Konstantin Moshkunov ◽  
Benjamin Tomasetti ◽  
Thomas Daphnis ◽  
Vincent Delmez ◽  
Kevin Vanvarenberg ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Imaging Mass Spectrometry ◽  
Molecular Ions ◽  
Limiting Factor ◽  
Ion Mass Spectrometry ◽  
Resolution Imaging ◽  
Biomolecular Analysis ◽  
Secondary Ion

Sensitivity to molecular ions remains a limiting factor for high resolution imaging mass spectrometry of organic and biological materials. Here, we investigate a variant of matrix-enhanced secondary ion mass spectrometry...

A novel sample preparation method for ultra-high vacuum (UHV) secondary ion mass spectrometry (SIMS) analysis

2018 ◽  
Vol 33 (9) ◽  
pp. 1559-1563 ◽  
Author(s):  
Wanfeng Zhang ◽  
Xiaoping Xia ◽  
Yanqiang Zhang ◽  
Touping Peng ◽  
Qing Yang
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Earth Science ◽  
High Vacuum ◽  
High Sensitivity ◽  
Science Research ◽  
Ultra High Vacuum ◽  
Wide Range ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Secondary ion mass spectrometry (SIMS) has been applied to analyze a wide range of materials for earth science research due to its high sensitivity, high precision and capacity for in situ micro-analysis.

Imaging Mass Spectrometry of Fingermarks on Brass Bullet Casings using Sample Rotation

The Analyst ◽  
2021 ◽  
Author(s):  
Charles Lee ◽  
David Scurr ◽  
Long Jiang ◽  
Andrew Kenton ◽  
Shaun Beebe ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Imaging Mass Spectrometry ◽  
High Vacuum ◽  
Time Of Flight ◽  
Ultra High Vacuum ◽  
Sample Rotation ◽  
Tof Sims ◽  
Rotation Stage ◽  
Secondary Ion

A rotation stage was developed to allow the surface of bullet casings to be imaged under ultra-high vacuum (UHV) conditions using time-of-flight secondary ion mass spectrometry (ToF -SIMS). Experiments were...

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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