scholarly journals Identification of the Cause of the Stem Neck Fracture in the Hip Joint Endoprosthesis

2018 ◽  
Vol 23 (1) ◽  
pp. 223-234
Author(s):  
A.M. Ryniewicz ◽  
Ł. Bojko ◽  
A. Ryniewicz ◽  
P. Pałka ◽  
W. Ryniewicz

AbstractEndoprosthesis stem fractures are among the rarest complications that occur after hip joint arthroplasty. The aim of this paper is to evaluate the causes of the fractures of the Aura II stem neck, which is an element of an endoprosthesis implanted in a patient. In order to achieve it, a radiogram was evaluated, the FEM analysis was carried out for the hip joint replaced using the Aura II prosthesis and scanning tests as well as a chemical analysis were performed for the focus of fatigue. The tests performed indicate that the most probable causes leading to the fatigue fracture of the Aura II stem under examination were material defects in the process of casting and forging (forging the material with delamination and the presence of brittle oxides and carbides) that resulted in a significant reduction of strength and resistance to corrosion. In the light of an unprecedented stem neck fracture, this information should be an indication for non-destructive tests of ready-made stems aiming to discover the material and technological defects that may arise in the process of casting and drop forging.

2007 ◽  
Vol 40 ◽  
pp. S558 ◽  
Author(s):  
V. Fuis ◽  
T. Návrat ◽  
P. Hlavon ◽  
M. Koukal ◽  
M. Houfek

1998 ◽  
Vol 278-281 ◽  
pp. 852-857
Author(s):  
G. Chiari ◽  
R. Compagnoni ◽  
R. Giustetto

2008 ◽  
Vol 600-603 ◽  
pp. 345-348 ◽  
Author(s):  
Kendrick X. Liu ◽  
X. Zhang ◽  
Robert E. Stahlbush ◽  
Marek Skowronski ◽  
Joshua D. Caldwell

Material defects such as Si-core and C-core partial dislocations (PDs) and threading screw dislocations (TSDs) and threading edge dislocations (TEDs) are being investigated for their contributions to device performances in 4H-SiC. Non-destructive electroluminescence and photoluminescence techniques can be powerful tools for examining these dislocations. In this report, these techniques were used to reveal the different spectral characteristics for the mentioned dislocations. At higher injection levels, both the Si-core and C-core PDs possessed a spectral peak at 700 nm. However, at lower injection levels, the spectral peak for the Si-core PD remained at 700 nm while the peak for the C-core moved to longer wavelengths. For the threading dislocations, TSDs possessed a peak between 800 and 850 nm while the TEDs possessed a peak at 600 nm independent of the injection levels.


Sign in / Sign up

Export Citation Format

Share Document