scholarly journals Slow light with interleaved p-n junction to enhance performance of integrated Mach-Zehnder silicon modulators

Nanophotonics ◽  
2019 ◽  
Vol 8 (9) ◽  
pp. 1485-1494 ◽  
Author(s):  
Marco Passoni ◽  
Dario Gerace ◽  
Liam O’Faolain ◽  
Lucio Claudio Andreani

AbstractSlow light is a very important concept in nanophotonics, especially in the context of photonic crystals. In this work, we apply our previous design of band-edge slow light in silicon waveguide gratings [M. Passoni et al, Opt. Express 26, 8470 (2018)] to Mach-Zehnder modulators based on the plasma dispersion effect. The key idea is to employ an interleaved p-n junction with the same periodicity as the grating, in order to achieve optimal matching between the electromagnetic field profile and the depletion regions of the p-n junction. The resulting modulation efficiency is strongly improved as compared to common modulators based on normal rib waveguides, even in a bandwidth of 20–30 nm near the band edge, while the total insertion loss due to free carriers is not increased. The present concept is promising in view of realizing slow-light modulators for silicon photonics with reduced energy dissipation.

2018 ◽  
Vol 26 (7) ◽  
pp. 8470 ◽  
Author(s):  
Marco Passoni ◽  
Dario Gerace ◽  
Liam O’Faolain ◽  
Lucio Claudio Andreani

CLEO: 2015 ◽  
2015 ◽  
Author(s):  
Yosuke Terada ◽  
Yosuke Hinakura ◽  
Keiko Hojo ◽  
Naoya Yazawa ◽  
Tomohiko Watanabe ◽  
...  

Author(s):  
Hadar Pinhas ◽  
Yossef Danan ◽  
Moshe Sinvani ◽  
Meir Danino ◽  
Zeev Zalevsky

2000 ◽  
Vol 640 ◽  
Author(s):  
K. Miller ◽  
Q. Zhou ◽  
J. Chen ◽  
M. O. Manasreh ◽  
Z. C. Feng ◽  
...  

ABSTRACTOptical absorption spectra of undoped, n-type, and semi-insulating 6H and 4H bulk silicon carbide (SiC) were obtained in the spectral region of 200 – 3200 nm (6.20 – 0.3875 eV). Several features were observed in the absorption spectra collected for various samples. A sharp peak below the band gap was observed in 4H SiC. The intensity of this peak was observed to increase in samples that exhibit larger absorption due to free carriers, which leads us to conclude that the defect responsible for this peak is also the source of the free carriers in the materials. Additionally, a series of optical absorption peaks separated by approximately 21 meV were observed around 0.9185 eV (1350 nm). These peaks are zero phonon lines of intraband transitions in the VSi 3d shell. The optical absorption near the band edge was observed to be sample dependent. The variation of the band gap as a function of temperature is also observed to be sample dependent.


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