Post-Irradiation Characterization of Ultra-High-Fluence Zircaloy-2 Plate

2008 ◽  
pp. 139-139-31 ◽  
Author(s):  
ST Mahmood ◽  
DM Farkas ◽  
RB Adamson ◽  
Y Etoh
Keyword(s):  
High Fluence ◽  
Post Irradiation

Crystallographic Characterization of Dislocation Loops in Irradiated Tungsten

1968 ◽  
Vol 26 ◽  
pp. 290-291
Author(s):  
Robert C. Rau
Keyword(s):  
Electron Microscope ◽  
Ambient Temperature ◽  
Dislocation Loops ◽  
Polycrystalline Specimen ◽  
Post Irradiation ◽  
Neutron Fluences

Previous work has shown that post-irradiation annealing, at temperatures near 1100°C, produces resolvable dislocation loops in tungsten irradiated to fast (E > 1 MeV) neutron fluences of about 4 x 1019 n/cm2 or greater. To crystallographically characterize these loops, tilting experiments were carried out in the electron microscope on a polycrystalline specimen which had been irradiated to 1.5 × 1021 n/cm2 at reactor ambient temperature (∼ 70°C), and subseouently annealed for 315 hours at 1100°C. This treatment produced large loops averaging 1000 Å in diameter, as shown in the micrographs of Fig. 1. The orientation of this grain was near (001), and tilting was carried out about axes near [100], [10] and [110].

Optical, electrical, and chemical characterization of nanostructured InxGa1-xN formed by high fluence In+ ion implantation into GaN

2020 ◽  
pp. 110541
Author(s):  
C.A. Hernández-Gutiérrez ◽  
Yuriy Kudriavtsev ◽  
Dagoberto Cardona ◽  
A.G. Hernández ◽  
J.L. Camas-Anzueto
Keyword(s):  
Ion Implantation ◽  
Chemical Characterization ◽  
High Fluence

scholarly journals Raman and TEM characterization of high fluence C implanted nanometric Si on insulator

2012 ◽  
Vol 258 (19) ◽  
pp. 7395-7400 ◽  
Author(s):  
R.M.S. dos Reis ◽  
R.L. Maltez ◽  
E.C. Moreira ◽  
Y.P. Dias ◽  
H. Boudinov
Keyword(s):  
High Fluence ◽  
Tem Characterization

Characterization of n-GaN dilute magnetic semiconductors by cobalt ions implantation at high-fluence

2012 ◽  
Vol 324 (5) ◽  
pp. 797-801 ◽  
Author(s):  
G. Husnain ◽  
Yao Shu-De ◽  
Ishaq Ahmad ◽  
H.M. Rafique ◽  
Arshad Mahmood
Keyword(s):  
Magnetic Semiconductors ◽  
Dilute Magnetic Semiconductors ◽  
High Fluence ◽  
Cobalt Ions ◽  
Ions Implantation

Characterization of high fluence irradiations on advanced triple junction solar cells

2013 ◽  
Author(s):  
S. I. Maximenko ◽  
S. R. Messenger ◽  
R. Hoheisel ◽  
D. Scheiman ◽  
M. Gonzalez ◽  
...  
Keyword(s):  
Solar Cells ◽  
Triple Junction ◽  
High Fluence

Characterization of Atomic Defects and Their Aggregates Using Positron Annihilation Spectroscopy

1984 ◽  
Vol 41 ◽  
Author(s):  
R. W. Siegel ◽  
M. J. Fluss ◽  
L. C. Smedskjaer
Keyword(s):  
Electronic Structure ◽  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy ◽  
Molecular Solids ◽  
Microstructure Development ◽  
Post Irradiation ◽  
Defect Sites ◽  
Atomic And Electronic Structure

AbstractPositrons localize in trapped states at a variety of defect sites in solids, from which they subsequently annihilate with unique observable characteristics. As such, the positron is a valuable probe for the study of these defects. Positron annihilation spectroscopy (PAS) has made significant contributions in recent years to the determination of atomic defect properties in metals and alloys, and in molecular solids as well. It has also been used extensively in the monitoring and characterization of vacancy-like microstructure development, as occurs during post-irradiation annealing. The characterization of defects using PAS is selectively reviewed and some possibilities for using the positron as a localized probe of the atomic and electronic structure of atomic defects and their aggregates are discussed.

Characterization of stochastic noise and post-irradiation density growth for reflective-type radiochromic film in therapeutic photon beam dosimetry

2016 ◽  
Vol 32 (10) ◽  
pp. 1314-1320 ◽  
Author(s):  
Takeshi Kamomae ◽  
Masataka Oita ◽  
Naoki Hayashi ◽  
Motoharu Sasaki ◽  
Hideki Aoyama ◽  
...  
Keyword(s):  
Photon Beam ◽  
Radiochromic Film ◽  
Stochastic Noise ◽  
Post Irradiation ◽  
Density Growth ◽  
Beam Dosimetry
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