Annealing Effect on the Chemical Composition of a Synchrotron Radiation Irradiated Polytetrafluoroethylene (PTFE) Surface by the X-ray Photoelectron Spectroscopy

2010 ◽  
Vol 130 (10) ◽  
pp. 1741-1745
Author(s):  
Yuichi Haruyama ◽  
Shinji Matsui ◽  
Tomoya Ideta ◽  
Hiroyuki Ishigaki
Keyword(s):  
Chemical Composition ◽  
Synchrotron Radiation ◽  
Photoelectron Spectroscopy ◽  
Annealing Effect ◽  
X Ray ◽  
Ptfe Surface

Pigments analysis in cartonages of an Egyptian mummy of the Roman period using X-ray fluorescence spectrometry

2005 ◽  
Vol 80 (1) ◽  
Author(s):  
Cristiane Calza ◽  
Marcelino J. Anjos I ◽  
Sheila M.F. Mendonça de Souza ◽  
Antonio Brancaglion Jr ◽  
Ricardo T. Lopes
Keyword(s):  
Chemical Composition ◽  
Synchrotron Radiation ◽  
Fluorescence Analysis ◽  
Spectroscopic Technique ◽  
Roman Period ◽  
Metal Alloys ◽  
Egyptian Mummy ◽  
X Ray ◽  
Radiation Technique ◽  
Radiation Laboratory

This work evaluates the chemical composition of pigments used in decorative paintings in the coffin cartonage fragments and linen wrappings of an Egyptian mummy, using X-ray microfluorescence with synchrotron radiation technique. The measures were obtained at the XRF beamline of the National Synchrotron Radiation Laboratory (LNLS). This Roman period female mummy is one of the most important mummies in the National Museum because of its unconventional embalming with disarticulated legs and arms. X-ray fluorescence analysis is a widely used spectroscopic technique in archaeometry for investigating the chemical composition of pigments in manuscripts, paintings, ceramics and other artifacts, metal alloys, and stones. Knowledge of composition allows pigment characterization through major or minor constituents, and makes it possible to establish the provenance, age, and consequently, the authenticity of the artifact.

scholarly journals Depth Profiling of the Chemical Composition of Free-Standing Carbon Dots Using X-ray Photoelectron Spectroscopy

2018 ◽  
Vol 122 (26) ◽  
pp. 14889-14897 ◽  
Author(s):  
Irene Papagiannouli ◽  
Minna Patanen ◽  
Valérie Blanchet ◽  
John D. Bozek ◽  
Manuel de Anda Villa ◽  
...  
Keyword(s):  
Chemical Composition ◽  
Photoelectron Spectroscopy ◽  
Carbon Dots ◽  
Depth Profiling ◽  
Free Standing ◽  
X Ray

Influence of nitrite on chemical composition of passivation film of steel bars under the coupling effects of carbonization and chloride

2019 ◽  
Vol 66 (2) ◽  
pp. 230-235 ◽  
Author(s):  
Junzhe Liu ◽  
Jundi Geng ◽  
Hui Wang ◽  
Mingfang Ba ◽  
Zhiming He
Keyword(s):  
Chemical Composition ◽  
Photoelectron Spectroscopy ◽  
Chloride Solution ◽  
Layer Structure ◽  
Coupling Effects ◽  
Content Type ◽  
X Ray ◽  
Passivation Film ◽  
Steel Bars ◽  
Micro Structures

Purpose This paper aims to study the influence of NaNO2 on the chemical composition of passivation film. Design/methodology/approach X-ray photoelectron spectroscopy and X-ray diffraction were selected to determine the composition of passivation film of steel bars in mortar. The specimens were exposed to the chloride solution, carbonation environment and the coupling effects of chloride solution and carbonation. The chemical composition and micro structures at 0 and 5 nm from the outer surface of the passivation film of steel bars were analyzed. Findings Results showed that the nitrite inhibitor improved the forming rate of the passivation film and increased the mass ratio of Fe3O4 to FeOOH on the surface of steel bars. The component of Fe3O4 at 5 nm of the steel passivation film was more than that at 0 nm. Sodium ferrite in the pore solution was easily hydrolyzed and then FeOOH was formed. Therefore, due to the nitrite inhibitor, a “double layer structure” of the passivation film was formed to prevent steels bars from corrosion. Originality/value This is original work and may help the researchers further understand the mechanism of rust resistance by nitrite inhibitor.

EPITAXY OF ULTRATHIN CoO FILMS STUDIED BY XPD AND GIXRD

2002 ◽  
Vol 09 (02) ◽  
pp. 937-941 ◽  
Author(s):  
P. LUCHES ◽  
C. GIOVANARDI ◽  
T. MOIA ◽  
S. VALERI ◽  
F. BRUNO ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Lattice Constant ◽  
Photoelectron Spectroscopy ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Direction Parallel ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Rocksalt Structure ◽  
Plane Lattice

CoO layers have been grown by exposing to oxygen the (001) body-centered-tetragonal (bct) surface of a Co ultrathin film epitaxially grown on Fe(001). Different oxide thicknesses in the 2–15 ML range have been investigated by means of synchrotron-radiation-based techniques. X-ray photoelectron spectroscopy has been used to check the formation of the oxide films; X ray photoelectron diffraction has given information concerning the symmetry of their unit cell; grazing incidence X-ray diffraction has allowed to evaluate precisely their in-plane lattice constant. The films show a CoO(001) rocksalt structure, rotated by 45° with respect to the bct Co substrate, with the [100] direction parallel to the substrate [110] direction. Their in-plane lattice constant increases as a function of thickness, to release the in-plane strain due to the 3% mismatch between the bulk CoO phase and the underlying substrate.

Synchrotron Radiation Soft X-ray Induced Reduction in Graphene Oxide Characterized by Time-Resolved Photoelectron Spectroscopy

2015 ◽  
Vol 119 (23) ◽  
pp. 12910-12915 ◽  
Author(s):  
Chi-Yuan Lin ◽  
Cheng-En Cheng ◽  
Shuai Wang ◽  
Hung Wei Shiu ◽  
Lo Yueh Chang ◽  
...  
Keyword(s):  
Graphene Oxide ◽  
Synchrotron Radiation ◽  
Photoelectron Spectroscopy ◽  
Time Resolved ◽  
X Ray
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