scholarly journals Monte Carlo Simulation of Illuminance Distribution in Infinitely Long Interior with Linear Source of Complex Luminous Intensity Distribution

1990 ◽  
Vol 110 (4) ◽  
pp. 284-285
Author(s):  
Masayoshi Nagata
2022 ◽  
Vol 2149 (1) ◽  
pp. 012015
Author(s):  
M Katona ◽  
K Trampert ◽  
C Schwanengel ◽  
U Krüger ◽  
C Neumann

Abstract Imaging Luminance Measuring Device (ILMD) based luminous intensity distribution measurement systems are an established method for measuring the luminous intensity distribution (LID) of light sources in the far field. The advantage of this system is the high-resolution acquisition of a large angular range with one image. For the uncertainty budget, the mathematical description of the system can be divided into photometric and geometric contributions. In the following, we will present a Monte-Carlo approach to analyse the geometric contributions which are the uncertainty of measurement direction and measurement distance. Therefore, we set up a geometric system description based on kinematic transformations that describes the connection between detector and light source position. To consider all relevant input quantities we simulate the adjustment and measurement process. Finally, an analysis of the geometric input parameters is shown.


1998 ◽  
Vol 30 (4) ◽  
pp. 159-164 ◽  
Author(s):  
L. Chen ◽  
M. Suzuki ◽  
T. Goda ◽  
N. Yoshimura

2020 ◽  
Vol 2 (2) ◽  
pp. 97-101
Author(s):  
Choirul Anam ◽  
Djarwani S Soejoko ◽  
Freddy Haryanto ◽  
Sitti Yani ◽  
Geoff Dougherty

In external beam radiotherapy, the photons from a linear accelerator (linac) machine undergo multiple interactions, not only in the patient but also in the linac head and the air column between the linac head and the patient. Electrons are released from these interactions and contaminate the beams. The current study evaluates electron contamination for 6 MV photon beams from an Elekta linac using Monte Carlo simulation. The linac head was simulated by the BEAMnrc code and the absorbed dose in a phantom was calculated using the DOSXYZnrc code. The parameters of the initial electron beams on the target, such as mean energy and radial intensity distribution, were determined by matching the calculated dose distributions with the measured dose (at 10 x 10 cm2 field size and 90 cm source-skin distance). The central axis depth-dose curves of electron contamination were calculated for various field sizes from 5 x 5 cm2 to 40 x 40 cm2. We investigated the components that generated the electron contamination for a field size of 10 x 10 cm2. The optimal initial electron beam energy was 6.3 MeV with a full-width half maximum (FWHM) of the radial intensity distribution of 1.0 mm. These parameters were found to be in good agreement with the measured data. Electron contamination increased as the field size increased. At a depth of 1.0 mm and field sizes of 5 x 5, 10 x 10, 20 x 20, 30 x 30, and 40 x 40 cm2, the doses from electron contamination were 3.71, 5.19, 14.39, 18.97 and 20.89 %, respectively. Electron contamination decreased with increased depth. At a depth of 15 mm, the electron contamination was about 1 %. It was mainly generated in the air column between the linac head and the phantom (3.65 %), the mirror (0.99 %), and the flattening filter (0.59 %) (for the depth of 1.0 mm and the field size of 10 x 10 cm2).


Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.


Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.


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