Effect of temperature during the synthesis process of CdSe nanoparticles using the colloidal technique

MRS Advances ◽  
2020 ◽  
Vol 5 (63) ◽  
pp. 3389-3395
Author(s):  
R. González-Díaz ◽  
D. Fernández-Sánchez ◽  
P. Rosendo-Francisco ◽  
G. Sánchez-Legorreta

AbstractIn this work, the first results of the effects of temperature during the production of Se2- ions and the effect during the interaction of Cd2+ and Se2- ions in the synthesis process of CdSe nanoparticles are presented. The synthesis of CdSe was carried out by the colloidal technique, in the first one we used a temperature of 63 °C to produce Se2- ions and in the second one an interaction temperature of 49 °C. The samples were characterized using a Scanning Electron Microscope (SEM) and a Scanning Tunneling Microscope (STM). From the SEM micrographs it was possible to identify the thorns formation and irregular islands. STM micrographs reveal elliptical shapes with a regular electron cloud profile.

2003 ◽  
Vol 10 (06) ◽  
pp. 963-980 ◽  
Author(s):  
SHUJI HASEGAWA ◽  
ICHIRO SHIRAKI ◽  
FUHITO TANABE ◽  
REI HOBARA ◽  
TAIZO KANAGAWA ◽  
...  

For in-situ measurements of the local electrical conductivity of well-defined crystal surfaces in ultrahigh vacuum, we have developed two kinds of microscopic four-point probe methods. One involves a "four-tip STM prober," in which four independently driven tips of a scanning tunneling microscope (STM) are used for measurements of four-point probe conductivity. The probe spacing can be changed from 500 nm to 1 mm. The other method involves monolithic micro-four-point probes, fabricated on silicon chips, whose probe spacing is fixed around several μm. These probes are installed in scanning-electron-microscopy/electron-diffraction chambers, in which the structures of sample surfaces and probe positions are observed in situ. The probes can be positioned precisely on aimed areas on the sample with the aid of piezoactuators. By the use of these machines, the surface sensitivity in conductivity measurements has been greatly enhanced compared with the macroscopic four-point probe method. Then the conduction through the topmost atomic layers (surface-state conductivity) and the influence of atomic steps on conductivity can be directly measured.


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