Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7−x thin films

2000 ◽  
Vol 15 (5) ◽  
pp. 1069-1075 ◽  
Author(s):  
O. Martínez ◽  
J. Jiménez ◽  
D. Chambonnet ◽  
C. Belouet
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Grain Boundaries ◽  
Grain Orientation ◽  
Structural Changes ◽  
Large Angle ◽  
Lateral Resolution ◽  
Micro Raman Spectroscopy ◽  
High Lateral Resolution

Superconducting YBa2Cu3O7−x (YBCO) thin films grown by pulser-laser-assisted deposition were studied by micro-Raman spectroscopy. This technique was used to estimate the epitaxial quality of the films in terms of the presence of c-axis- and a-axis-oriented areas. The advantage of micro-Raman spectroscopy is its high lateral resolution, and this was used to study the homogeneity of the films at submicrometric level. Local structural changes from a large number of intergrain regions were revealed by changes of the Raman parameters. For example, the aggregation of a-axis-oriented grains formed needle-shaped macrograins. Micro-Raman measurements suggest that these grains were seeded at large-angle grain boundaries in c-axis-oriented areas.

Study of Grain Boundaries in YBCO Thin Films Using Microraman Spectroscopy

1995 ◽  
Vol 401 ◽  
Author(s):  
O. Martinez ◽  
J. Jimenez ◽  
P. Martin ◽  
D. Chambonnet ◽  
S. Degoy ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Boundaries ◽  
Relative Intensity ◽  
Lateral Resolution ◽  
Oxygen Sublattice ◽  
Ybco Thin Films ◽  
High Lateral Resolution ◽  
Raman Microprobe ◽  
Raman Modes ◽  
Microraman Spectroscopy

AbstractMicroRaman spectroscopy allows to identify the presence of c| and c⊥ oriented grains in YBCO thin films. This is achieved by the observation of two Raman modes associated with the oxygen sublattice vibrations, ˜500 cm−1 and ˜338 cm−1. The relative intensity of these Raman modes is related to the presence of c⊥ and c⊥;. oriented grains. Using the high lateral resolution of the Raman microprobe (<1 μm) some needle shaped grains of the films were scanned. The different Raman parameters were analyzed, showing noteworthy transformations at the [c|;]/[c⊥] boundaries. In particular the Raman mode corresponding to the out of phase O (2)– O(3) in plane vibrations (˜338 cm−1) was found to be narrowed, which should account for a decoupling of the phonon with the electronic continuum.

scholarly journals Structural Changes in Doped Ge2Sb2Te5 Thin Films Studied by Raman Spectroscopy

2013 ◽  
Vol 44 ◽  
pp. 82-90 ◽  
Author(s):  
S. Kozyukhin ◽  
M. Veres ◽  
H.P. Nguyen ◽  
A. Ingram ◽  
V. Kudoyarova
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Structural Changes

Raman studies of reactive DC-magnetron sputtered thin films of YBaCuO on MgO

1989 ◽  
Vol 4 (6) ◽  
pp. 1312-1319 ◽  
Author(s):  
K. C. Sheng ◽  
S. J. Lee ◽  
Y. H. Shen ◽  
X. K. Wang ◽  
E. D. Rippert ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Critical Temperature ◽  
Impurity Content ◽  
Superconducting Films ◽  
Annealing Process ◽  
Rapid Thermal Annealing Process ◽  
Zero Resistance ◽  
Thermal Annealing Process

Raman spectroscopy was employed to study Y–Ba–Cu–O films prepared by multilayer, reactive sputtering from separate Y, Cu, and Ba0.5Cu0.5 targets. A set of films having the composition YxBa2CuyOz with 0.7 < x < 1.8 and 2.8 < y < 3.5 and critical temperature with zero resistance, Tc(R = 0), ranging from 25 to 90 K was studied with the Raman technique. The correlation between Raman data and critical temperature, Tc, was investigated. This technique provides important information concerning the film crystallinity, homogencity, and impurity content (including other phases) which is useful in judging the quality of high Tc superconducting films. We also found that the rapid thermal annealing process is a very efficient way to reduce chemical reactions between the film and the substrate.

Raman Spectroscopy: A Unique Tool for the Study of Thin Films

2000 ◽  
Vol 615 ◽  
Author(s):  
Ingrid De Wolf
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Local Stress ◽  
Micro Raman Spectroscopy

ABSTRACTIn this paper, the different applications of Raman spectroscopy for the study of thin films is briefly discussed, using examples from microelectronics. Special attention is given to the application of micro-Raman spectroscopy for the measurement of local stress in and near films.

High Lateral Resolution Analysis Of Stresses In Silver Thin Films By Means Of Raman Microscopy

2010 ◽  
Author(s):  
Thomas Wermelinger ◽  
Shelley A. Scott ◽  
Max G. Lagally ◽  
Christian Hinderling ◽  
Ralph Spoleank ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Microscopy ◽  
Lateral Resolution ◽  
High Lateral Resolution ◽  
Resolution Analysis ◽  
Silver Thin Films

scholarly journals Localized Strain Measurement in Molecular Beam Epitaxially Grown Chalcogenide Thin Films by Micro-Raman Spectroscopy

ACS Omega ◽  
2020 ◽  
Vol 5 (14) ◽  
pp. 8090-8096
Author(s):  
Qiu Li ◽  
Yong Wang ◽  
Tiantian Li ◽  
Wei Li ◽  
Feifan Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Strain Measurement ◽  
Molecular Beam ◽  
Micro Raman Spectroscopy ◽  
Chalcogenide Thin Films
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