The Structure of a Near Coincidence Σ=5, [001] Twist Boundary in Silicon

1982 ◽  
Vol 14 ◽  
Author(s):  
Mark Vaudin ◽  
Dieter Ast
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dislocation Structure ◽  
Lattice Theory ◽  
Small Deviation ◽  
Twist Boundary ◽  
Transmission Electron ◽  
Primary Dislocation ◽  
Dislocation Content

ABSTRACTThe dislocation structure of a near coincidence Σ=5 [001]twist boundary in silicon was studied using transmission electron microscopy. Secondary dislocations, with localized cores, were observed in the boundary accommodating a small deviation (<.5°) from perfect coincidence. The O-lattice theory for general low angle boundaries was extended to calculate the expected dislocation content of near coincidence boundaries. Comparison between predictions and observations was used to deduce information on the primary dislocation structure of the boundary.

Dislocation Dissociation in the Σ13 Grain Boundary in Silicon

1991 ◽  
Vol 238 ◽  
Author(s):  
Laurent Sagalowicz ◽  
Richard Beanland ◽  
William A. T. Clark
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Grain Boundary ◽  
Crystal Lattice ◽  
Dislocation Structure ◽  
Alternative Structures ◽  
Transmission Electron ◽  
Dislocation Dissociation

ABSTRACTTransmission electron microscopy has been used to study the atomic and dislocation structure of deformed and undeformed Σ13 {510} boundary in Si. It is shown that there are several alternative structures for this boundary, which may be separated by imperfect and partial grain boundary dislocations. It is also shown that the dissociation of crystal lattice dislocations which interact with the boundary during deformation results is far more complicated than simple geometrical models applicable in monatomic materials predicts.

Interfacial Reactions during Explosive Bonding

2014 ◽  
Vol 783-786 ◽  
pp. 1476-1481 ◽  
Author(s):  
Henryk Paul
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dislocation Structure ◽  
Energy Dispersive Spectrometry ◽  
Ion Beam ◽  
Intermetallic Phases ◽  
Thin Foils ◽  
Transmission Electron ◽  
Focus Ion Beam ◽  
Beam Technique

The layers near the interface of explosively welded plates were investigated by means of microscopic observations, mostly with the use of transmission electron microscopy (and Focus Ion Beam technique for the thin foils preparation) equipped with energy dispersive spectrometry. The metal compositions based on steels and Ti, Zr, Ta or Cu, were analyzed. The study was focused on the identification of the intermetallic phases inside the melted zones, the possible interdiffusion between the bonded metals and the changes in the dislocation structure.

Intrinsic Misfit Dislocations on 120° Interface in TiAl

1998 ◽  
Vol 552 ◽  
Author(s):  
V. Paidar ◽  
S. Zghal ◽  
A. Couret
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dislocation Structure ◽  
Lamellar Structure ◽  
Interface Plane ◽  
Misfit Dislocations ◽  
Transmission Electron

ABSTRACTThe misfit between 120° rotational variants of the lamellar structure in γ-phase TiAl with the ordered L10 lattice is analysed. It is shown that such a misfit on the (111) interface plane, which has a shear character, can be accommodated by one, two or three arrays of interface intrinsic dislocations. One example of interface dislocation structure observed by transmission electron microscopy is presented.

Techniques for Transmission Electron Microscopy of Fiber-Matrix Interfaces in Aluminum Alloy-Boron Composites by Ion Erosio

1971 ◽  
Vol 29 ◽  
pp. 204-205
Author(s):  
G. G. Shaw
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Aluminum Alloy ◽  
Electron Beam ◽  
Pure Aluminum ◽  
Ion Milling ◽  
Transmission Electron ◽  
Fiber Matrix ◽  
Ion Erosion ◽  
Row Of Fibers

The morphology and composition of the fiber-matrix interface can best be studied by transmission electron microscopy and electron diffraction. For some composites satisfactory samples can be prepared by electropolishing. For others such as aluminum alloy-boron composites ion erosion is necessary.When one wishes to examine a specimen with the electron beam perpendicular to the fiber, preparation is as follows: A 1/8 in. disk is cut from the sample with a cylindrical tool by spark machining. Thin slices, 5 mils thick, containing one row of fibers, are then, spark-machined from the disk. After spark machining, the slice is carefully polished with diamond paste until the row of fibers is exposed on each side, as shown in Figure 1.In the case where examination is desired with the electron beam parallel to the fiber, preparation is as follows: Experimental composites are usually 50 mils or less in thickness so an auxiliary holder is necessary during ion milling and for easy transfer to the electron microscope. This holder is pure aluminum sheet, 3 mils thick.

Direct Observation of Heat Exchanger Deposits by Cross Sectioning

1967 ◽  
Vol 25 ◽  
pp. 364-365
Author(s):  
R. W. Anderson ◽  
D. L. Senecal
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Heat Exchanger ◽  
Direct Observation ◽  
Cross Sections ◽  
Preparation Method ◽  
Specimen Preparation ◽  
Flowing Water ◽  
Transmission Electron ◽  
Deposit Layer

A problem was presented to observe the packing densities of deposits of sub-micron corrosion product particles. The deposits were 5-100 mils thick and had formed on the inside surfaces of 3/8 inch diameter Zircaloy-2 heat exchanger tubes. The particles were iron oxides deposited from flowing water and consequently were only weakly bonded. Particular care was required during handling to preserve the original formations of the deposits. The specimen preparation method described below allowed direct observation of cross sections of the deposit layers by transmission electron microscopy.The specimens were short sections of the tubes (about 3 inches long) that were carefully cut from the systems. The insides of the tube sections were first coated with a thin layer of a fluid epoxy resin by dipping. This coating served to impregnate the deposit layer as well as to protect the layer if subsequent handling were required.

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