Interfacial Reactions during Explosive Bonding

2014 ◽  
Vol 783-786 ◽  
pp. 1476-1481 ◽  
Author(s):  
Henryk Paul
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dislocation Structure ◽  
Energy Dispersive Spectrometry ◽  
Ion Beam ◽  
Intermetallic Phases ◽  
Thin Foils ◽  
Transmission Electron ◽  
Focus Ion Beam ◽  
Beam Technique

The layers near the interface of explosively welded plates were investigated by means of microscopic observations, mostly with the use of transmission electron microscopy (and Focus Ion Beam technique for the thin foils preparation) equipped with energy dispersive spectrometry. The metal compositions based on steels and Ti, Zr, Ta or Cu, were analyzed. The study was focused on the identification of the intermetallic phases inside the melted zones, the possible interdiffusion between the bonded metals and the changes in the dislocation structure.

The Microstructure of AlSi7Mg Alloy in as Cast Condition

2015 ◽  
Vol 229 ◽  
pp. 3-10 ◽  
Author(s):  
Bartłomiej Dybowski ◽  
Bogusława Adamczyk-Cieślak ◽  
Kinga Rodak ◽  
Iwona Bednarczyk ◽  
Andrzej Kiełbus ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Chemical Composition ◽  
Energy Dispersive Spectrometry ◽  
Intermetallic Phases ◽  
Transmission Electron ◽  
Alloy Microstructure ◽  
Cast Condition ◽  
Scanning Electron

The complex microstructure of as-cast AlSi7Mg alloy has been investigated. Microstructure observations were done using light microscopy, scanning electron microscopy and transmission electron microscopy. Chemical composition of the microstructure constituents was investigated by means of energy dispersive spectrometry, conducted both during SEM and STEM investigations. Selected area diffraction was used to identify the phases in the alloy. Microstructure of the alloy in the as-cast condition consists of Al-Si eutectic and intermetallic phases in the interdendritic regions. These are: Mg2Si, α-AlFeMnS, β-AlFeSi and π-AlFeSiMg phases. What is more, number of fine precipitates were found within the α-Al dendrites. Only the occurrence of U1 (MgAl2Si2) phase has been confirmed.

Cross-Sectional Transmission Electron Microscopy Sample Preparation Using Focus Ion Beam Machine and Wedge Technique

1999 ◽  
Vol 5 (S2) ◽  
pp. 894-895 ◽  
Author(s):  
Du Li ◽  
Rose Zhou ◽  
Rob Zanoya
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Focused Ion Beam ◽  
General Procedure ◽  
Ion Beam ◽  
Optical Microscope ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Focus Ion Beam ◽  
Tem Grid

As features on an IC chip become smaller than the resolution power of an optical microscope and of the size of the grinding particles, the trend for preparing cross-sectional transmission electron microscopy (TEM) samples at specific locations (bits) is moving towards using a focused ion beam (FIB) machine. Details on how to use a FIB machine to prepare cross-sectional TEM samples have been outlined in many references.The general procedure is to first mark the specific location (bit) in the FIB machine and then grind the sample down to about 20 microns, 10 microns on each side of the feature of interest. After grinding, the sample is mounted on a pre-cut TEM grid and thinned with the FIB to about 0.1 micron in the region containing the feature of interest. There are several disadvantages to this method. First, the sample goes into the FIB machine at least twice—once for FIB marks on the location and once again for the final thinning.

scholarly journals Transmission Electron Microscopy (TEM) Through Focused ION Beam (FIB) from Vitrified Chromium Wastes

2011 ◽  
Vol 9 (02) ◽  
Author(s):  
S. Ballesteros-Elizondo ◽  
J. R. Parga-Torres ◽  
J. Ma. Rincón-López ◽  
E. Palacios-González
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Ion Milling ◽  
Heterogeneous Samples ◽  
Thin Foils ◽  
Transmission Electron ◽  
Chromium Wastes ◽  
Heterogeneous Size

This study shows how the Focused Ion Beam (FIB) has been applied to vitrified materials obtained from chromiumwastes. Due to the issues arising during conventional Ar+ ion milling, it was necessary to thin these samples usingFIB. Difficulties came from the heterogeneous size between chromium spinels and the residual glass phase. The FIBwas applied to obtain thin foils from vitrified materials. These brittle and heterogeneous samples result in specimenswith many perforations and chipping when using conventional thinning below 100 nanometers. Alternatively, FIBallowed thinning in the range of 60 - 80 nanometers from specifically selected areas such as the areas containingspinel crystals Mg(Al,Cr)2O4 in order to facilitate the final Transmission Electron Microscopy (TEM) observations. Inthis paper, FIB is shown to be a very powerful microtool as a brittle samples preparation method as well as providingan alternative way for performing conventional ceramography and Ar+ ion milling. FIB is a much less destructivemethod with greater observed capacity in the quantity and analysis of microcrystalline phases.

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