Automatic Orientation Mapping with Synchrotron Radiation
Keyword(s):
AbstractSynchrotron radiation can be utilized to obtain Laue back reflection patterns of microscopic areas with very short exposure time. A method is presented to fully automatically evaluate Laue patterns. The experimental setup and procedure are outlined to determine the orientations of a large number of contiguous grains, and consequently to enable orientation mapping. Preliminary experimental results are presented.
2010 ◽
Vol 51
(6)
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pp. 908
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1983 ◽
2003 ◽
Vol 49
(6)
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pp. 687-691
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2019 ◽
Vol 195
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pp. 83-90
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2015 ◽
Vol 135
(4)
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pp. 692-698
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1981 ◽
Vol 37
(2)
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pp. 148-155