Characterization of Mocvd Grown Epitaxial Ceramic Oxide Thin Films

1989 ◽  
Vol 168 ◽  
Author(s):  
J. C. Parker ◽  
H. L. M. Chang ◽  
J. J. Xu ◽  
D. J. Lam

AbstractCharacterization of TiO2 films grown by the MOCVD technique was carried out using micro-Raman scattering. The effects of processing parameters on the film composition and morphology were investigated. The micro-Raman technique was shown to be a useful tool for characterizing oxide thin films grown by the MOCVD technique.

MRS Advances ◽  
2016 ◽  
Vol 1 (47) ◽  
pp. 3199-3205
Author(s):  
Manuel F. Martinez ◽  
Shaimum Shahriar ◽  
Donato Kava ◽  
Cheik Sana ◽  
Vanessa Castaneda ◽  
...  

ABSTRACTZinc oxide thin films were prepared via the sol-gel spin-coating method with the use of a spin processor. The film’s annealing parameters were varied to study their impact on the final film morphology and electrical properties. Characterization of the structural properties of the samples was carried on a X-ray diffractometer (XRD) and scanning electron microscopy. Electrical characterization was obtained with the use of a four point probe. Optical characterization of the samples was carried on a UV-Vis-NIR Spectrophotometer. Samples annealed under a cover are observed to have a higher transmission percentage on the visible light range while having a very small grain size and small relative resistivity. Samples annealed under standard atmospheric conditions show a larger grain size and resistivity, and correlated to it, a smaller transmission percentage. Samples annealed under vacuum prove to have a much more reduced optical, electrical, and structural properties when compared to the rest of the samples.


2021 ◽  
Vol 53 (5) ◽  
Author(s):  
M. Rahayi ◽  
M. H. Ehsani ◽  
Agnes C. Nkele ◽  
M. M. Shahidi ◽  
Fabian I. Ezema

1995 ◽  
Vol 25 (1-3) ◽  
pp. 482-485 ◽  
Author(s):  
Wan-Young Chung ◽  
Tae-Hoon Kim ◽  
Young-Ho Hong ◽  
Duk-Dong Lee

2021 ◽  
pp. 138874
Author(s):  
Izabela Kruk ◽  
Brian L. Scott ◽  
Erik B. Watkins ◽  
Laura E. Wolfsberg

2018 ◽  
Vol 5 (10) ◽  
pp. 20904-20911
Author(s):  
Sachin S Bharadwaj ◽  
B.W. Shivaraj ◽  
H.N. Narasimha Murthy ◽  
M Krishna ◽  
Manjush Ganiger ◽  
...  

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