Optical Properties and Internal Photoemission in Epitaxial Composites of CoSi2 Particles in Silicon
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ABSTRACTAn analysis of optical absorption and internal photoemission in epitaxial CoSi2 particles buried in silicon is carried out. The optical absorption is dominated by the well-known surface plasma resonance, and calculations of the surface plasma frequencies, using the previously measured dielectric constant of CoSi2, agree well with experiment. A model for the photoemission yield is presented which includes the effects of the surface plasmon excitation and decay. The model can reproduce the observed features of the yield in photoresponse experiments. A model for the replenishment of photoemitted carriers is also presented, in which the metal particles acquire a small steady-state charge under illumination.
2005 ◽
Vol 480-481
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pp. 287-292
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1992 ◽
Vol 96
(5)
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pp. 3370-3378
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1973 ◽
Vol 28
(5)
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pp. 662-667
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1989 ◽
Vol 36
(1-4)
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pp. 664-672
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