Use of Optical Emission Spectroscopy as a Diagnostic Technique for Plasma Deposition of Hydrogenated Amorphous Silicon and Carbon

1983 ◽  
Vol 30 ◽  
Author(s):  
F. J. Kampas

ABSTRACTOptical emission intensities have been measured as a function of composition for silane-argon and silane-hydrogen mixtures used in the deposition of hydrogenated amorphous silicon. It was found that changes in silane fraction have a large effect on the electron concentration and energy distribution in the discharge.

Author(s):  
Leonid Mochalov ◽  
Dominik Dorosz ◽  
Marcin Kochanowicz ◽  
Alexander Logunov ◽  
Aleksey Letnianchik ◽  
...  

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