Materials For Laser-Plasma X-Ray Source Targets Applicable To Lithography

1993 ◽  
Vol 306 ◽  
Author(s):  
M. Chaker ◽  
J.F. Pelletier ◽  
J.C. Kieffer

AbstractIn recent years, several X-ray lithography experiments involving laser plasma sources have been reported. The high X-ray conversion efficiency (η – 10%) in the keV range observed in various laboratories, using high laser intensities (I > 5 × 1012 W cm−2), has already made these sources an attractive alternative to the electron storage rings for X-ray lithography in proximity printing (XRL). In addition, X-rayproduction in the region around 130 Å has also been investigated at intensities of about 1011 W cm−2 for applications to X-ray Projection Lithography (XRPL). Conversion efficiency up to 1% into a 3 Å bandwidth has been demonstrated. In principle, a large variety of X-ray spectra can be obtained from a laser plasma source depending on the laser-target parameters. However, high conversion efficiencies, in a given spectral range, can only be achieved under specific plasma conditions (target atomic number, plasma temperature, plasma volume and spatio-temporal expansion...). This leads to some restrictions in possible target materials and irradiation conditions (laser wavelength, laser intensity, pulse duration). In this paper, we will discuss this physical aspect basing our analysis on both the theoretical and experimental studies of the X-ray spectra in different X-ray energy ranges and for various target atomic numbers. In addition, we will examine issues related to the laser plasma X-ray source design for both XRL and XRPL applications.

1992 ◽  
Vol 10 (4) ◽  
pp. 743-751 ◽  
Author(s):  
M. Chvojka ◽  
B. Králiková ◽  
E. Krouský ◽  
L. Láska ◽  
K. Maŝek ◽  
...  

The first harmonics beam generated by an iodine laser system was focused by an f/2 optics on an Al foil target. The X-ray output from the laser plasma both in the line and broad-band spectra was registered over an interval around the “ideal” focus. It was found that the maximum X-ray power is not obtained in the focus itself but for a somewhat larger focal spot outside the focus. To explain this phenomena, temperature and density measurements were in addition made. The plasma temperature evaluated from both the line (He-like Al XII resonant line and j, k, l satellites) and broad-band spectra (two foil method) was also measured and found to be largely constant in the vicinity of the focus. The line and broad-band temperatures differ, the broad-band temperature being about 25% higher. The electron density was equally determined using an intercombination line.


1993 ◽  
Vol 32 (34) ◽  
pp. 6934 ◽  
Author(s):  
Steven J. Haney ◽  
Kurt W. Berger ◽  
Glenn D. Kubiak ◽  
Paul D. Rockett ◽  
John Hunter

1994 ◽  
Vol 4 (9) ◽  
pp. 1669-1677 ◽  
Author(s):  
F. Bijkerk ◽  
L. Shmaenok ◽  
A. van Honk ◽  
R. Bastiaensen ◽  
Yu. Ya. Platonov ◽  
...  

1994 ◽  
Author(s):  
Daniel A. Tichenor ◽  
Glenn D. Kubiak ◽  
Michael E. Malinowski ◽  
Richard H. Stulen ◽  
Steven J. Haney ◽  
...  

1992 ◽  
Vol 10 (4) ◽  
pp. 689-696 ◽  
Author(s):  
W. Mróz ◽  
A. Nowak-Goroszczenko ◽  
J. Wołowski ◽  
E. Woryna

This article presents the tendency of the changes of Nd-laser plasma parameters in dependence upon increasing target atomic numbers. In the experiment, the following targets — (C8H8)n, SiO2, Al, Cu, Ta, and Au — were investigated. For targets with Z higher than 13, the two-temperature plasma is observed with temperatures Te =500–600 eV and Te≅ 100 eV. Energy carried by ions from the low-temperature plasma can be higher than half the total energy carried by ions. The number of ions from low-temperature, X-ray-heated plasma can be by an order of magnitude higher than the number of ions from thermal plasma (Te = 500–600 eV).


1993 ◽  
Author(s):  
G. D. Kubiak ◽  
K. W. Berger ◽  
S. J. Haney ◽  
D. A. Tichenor ◽  
R. H. Stulen ◽  
...  

1993 ◽  
Author(s):  
Martin C. Richardson ◽  
William T. Silfvast ◽  
Howard Bender III ◽  
Art Hanzo ◽  
Feng Jin ◽  
...  

1994 ◽  
Vol 23 (1-4) ◽  
pp. 211-214 ◽  
Author(s):  
L. Shmaenok ◽  
F. Bijkerk ◽  
E. Louis ◽  
A. van Honk ◽  
M.J. van der Wiel ◽  
...  

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