Grain Rotation in Thin Films of Gold

1995 ◽  
Vol 403 ◽  
Author(s):  
Alexander H. King ◽  
Karen E. Harris
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Grain Boundaries ◽  
Transmission Electron Microscope ◽  
Microstructural Development ◽  
Grain Rotation ◽  
Annealing Experiment ◽  
Transmission Electron ◽  
Individual Grains

AbstractTransmission electron microscope observations of microstructural development in thin films of gold are presented. In a sequential annealing experiment, we find that individual grains are constantly rotating and that this contributes to the rearrangement of grain boundaries by allowing their individual energies to vary.

Liquid Infiltration of MgO and Al2O3 Thin Films

1993 ◽  
Vol 318 ◽  
Author(s):  
Michael P. Mallamaci ◽  
Sundar Ramamurthy ◽  
C. Barry Carter
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Grain Boundaries ◽  
Transmission Electron Microscope ◽  
Bulk Materials ◽  
Ceramic Substrates ◽  
Liquid Infiltration ◽  
Transmission Electron ◽  
Before And After ◽  
Novel Method

ABSTRACTThe deposition of glass films on thin ceramic substrates is a novel method for investigation of the initial stages of liquid infiltration into the grain boundaries of these materials. By maintaining electron transparency at all stages of the experiment, the transmission electron microscope (TEM) can be used to characterize individual grain boundaries before and after penetration by a liquid. The method has been tested for the MgO and AI2O3 systems, which have extensively studied experimental counterparts in which the corresponding bulk materials are infiltrated by a siliceous liquid.

Microcharacterization of CuInSe2 Grown by Coevaporation and Selenization

1992 ◽  
Vol 283 ◽  
Author(s):  
M. H. Bode ◽  
M. M. Al-Jassim ◽  
J. Tuttle ◽  
D. Albin
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
Transmission Electron ◽  
Ordered Phases ◽  
Scanning Transmission ◽  
Second Phases ◽  
The Individual ◽  
Individual Grains

ABSTRACTThin films of CuInSe2, grown by coevaporation or by selenization of a Cu-In precursor, were analyzed in a scanning transmission electron microscope. While the coevaporated film shows clear evidence of second phases (Cu2Se) around the individual grains, no second phases could be found in the selenized material. Structural characterization also showed the presence of two ordered phases in the coevaporated films, the ordered-vacancy compound CuIn2Se3.5, and a CuPt-ordered phase of CuInSe2.

Crystal Structures on Growth of Pr0.7Ca0.3MnO3 Thin Films Analyzed by Transmission Electron Microscope

2007 ◽  
Vol 51 (12) ◽  
pp. 147 ◽  
Author(s):  
H. B. MOON ◽  
C. H. KIM ◽  
S. S. MIN ◽  
J. H. CHO ◽  
Y. K. KIM ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Crystal Structures ◽  
Transmission Electron Microscope ◽  
Transmission Electron
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