scholarly journals Phase transition characteristics of (Ge4Sb4Te6) thin films using high resolution transmission electron microscope and optical properties

2016 ◽  
Vol 08 (04) ◽  
pp. 22-32
Author(s):  
Z. S. El Mandouh ◽  
H. A. Zayed ◽  
A. H. Hammad ◽  
Ahmed. R.Wassel
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Optical Properties ◽  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Transmission Electron

High-Resolution Transmission Electron Microscope Analysis of Tungsten Carbide Thin Films

1998 ◽  
Vol 520 ◽  
Author(s):  
Wentao Qin ◽  
W. Shih ◽  
J. Lib ◽  
W. James ◽  
H. Siriwardaneane ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
High Resolution ◽  
Tungsten Carbide ◽  
Transmission Electron Microscope ◽  
Chemical Vapor ◽  
Unit Cell Size ◽  
Aspect Ratios ◽  
Transmission Electron ◽  
Diffraction Patterns

ABSTRACTElectron diffraction patterns and high-resolution transmission electron microscope (HREM) images show that the dominant phase in tungsten carbide thin films grown by plasma enhanced chemical vapor deposition is WC(1−x). The f.c.c crystal structure and the unit cell size of WC(1−x) have been determined via electron powder diffraction. The two largest and most dominant spacings in HREM images are the {111} and {002} spacings of WC(1−x). Cross lattice fringes along the two most densely populated zones of WC(1−x) are seen. The sizes and aspect ratios of nano-crystals have been measured from HREM images. Stereo analysis of individual nano-crystals has been done. Confirmation of the 3-D structure of WC(1−x) via spacings larger than 0.15 nm will require a tilt larger than 35° between images.

A New High Resolution Transmission Electron Microscope with Second-Zone Objective Lens

1969 ◽  
Vol 27 ◽  
pp. 176-177 ◽  
Author(s):  
H. Tochigi ◽  
H. Uchida ◽  
S. Shirai ◽  
K. Akashi ◽  
D. J. Evins ◽  
...  
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Objective Lens ◽  
High Excitation ◽  
Transmission Electron ◽  
New Instrument

A New High Excitation Objective Lens (Second-Zone Objective Lens) was discussed at Twenty-Sixth Annual EMSA Meeting. A new commercially available Transmission Electron Microscope incorporating this new lens has been completed.Major advantages of the new instrument allow an extremely small beam to be produced on the specimen plane which minimizes specimen beam damages, reduces contamination and drift.

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