Microstructures of Amorphic Diamond™ Films Deposited by Laser-Ablation

1995 ◽  
Vol 416 ◽  
Author(s):  
Hyunchul Sohn ◽  
Kannan Krishnan ◽  
Richard Fink
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Laser Ablation ◽  
Energy Loss ◽  
Annealing Temperature ◽  
Laser Ablation Method ◽  
Transmission Electron ◽  
Large Particles ◽  
Particulate Size ◽  
Electron Energy Loss

ABSTRACTMicrostructures of Amorphic Diamond™ films deposited by laser ablation method were investigated using transmission electron microscopy. The AD films matrix was homogeneous with a sp3-type bonding fraction of 40%∼45% confirmed by electron energy-loss spectroscopy. The sp3 bonding fraction decreased monotonically with increasing annealing temperature. The main inhomogeneity in Amorphic Diamond™ was observed to be particulates of high density (>105/cm2) distributed through the depth of the film. Particulate size ranged from ∼10nm to a few μm and most of them were identified to be graphite. Large particles (>0.5μm) were agglomerates of smaller graphite crystallites. Possible mechanisms for cold field emission are discussed based on the microstructures observed in these AD films.

Investigation of Switching Mechanism in HfO2-Based Oxide Resistive Memories by In-Situ Transmission Electron Microscopy and Electron Energy Loss Spectroscopy

2017 ◽  
Author(s):  
T. Dewolf ◽  
D. Cooper ◽  
N. Bernier ◽  
V. Delaye ◽  
A. Grenier ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Hafnium Dioxide ◽  
Switching Mechanism ◽  
Transmission Electron ◽  
Electron Energy Loss

Abstract Forming and breaking a nanometer-sized conductive area are commonly accepted as the physical phenomenon involved in the switching mechanism of oxide resistive random access memories (OxRRAM). This study investigates a state-of-the-art OxRRAM device by in-situ transmission electron microscopy (TEM). Combining high spatial resolution obtained with a very small probe scanned over the area of interest of the sample and chemical analyses with electron energy loss spectroscopy, the local chemical state of the device can be compared before and after applying an electrical bias. This in-situ approach allows simultaneous TEM observation and memory cell operation. After the in-situ forming, a filamentary migration of titanium within the dielectric hafnium dioxide layer has been evidenced. This migration may be at the origin of the conductive path responsible for the low and high resistive states of the memory.

Electron Energy-Loss Spectroscopy (EELS) of Fe-Bearing Olivine and Laihunite (an Oxidized Olivine)

2000 ◽  
Vol 6 (S2) ◽  
pp. 208-209
Author(s):  
Huifang Xu ◽  
Pingqiu Fu
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Structure Refinement ◽  
Iron Formation ◽  
Transmission Electron ◽  
Electron Energy Loss

Laihunite that has distorted olivine-type structure with ferric and ferrous irons and ordered distribution of vacancies was first discovered in a high-grade metamorphosed banded iron formation (BIF) [1, 2]. The laihunite coexisting with fayalite (Fe-olivine), magnetite, quartz, ferrosilite, garnet and hedenbergite, formed in the process of oxidation of fayalite [2, 3]. The structure refinement of 1-layer laihunite shows P21/b symmetry and ordered distribution of vacancies in half M1 sites of olivine structure [2, 3]. Early high-resolution transmission electron microscopy (HRTEM) study and HRTEM image simulation of the 1-layer laihunite verified the structure refinement [4].Specimens of weakly oxidized fayalite and laihunite containing fayalite islands collected from Xiaolaihe and Menjiagou of Liaoning Province, NE China, have been studied using selected area electron diffraction (SAED), high-resolution transmission electron microscopy (HRTEM), electron energy-loss spectroscopy (EELS), and X-ray energy-dispersive spectroscopy.

scholarly journals Synthesis of nanosized vanadium(v) oxide clusters below 10 nm

2019 ◽  
Vol 21 (37) ◽  
pp. 21104-21108 ◽  
Author(s):  
Maximilian Lasserus ◽  
Daniel Knez ◽  
Florian Lackner ◽  
Martin Schnedlitz ◽  
Roman Messner ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Energy Loss ◽  
Electron Energy Loss Spectroscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Helium Droplets ◽  
Transmission Electron ◽  
Mean Diameter ◽  
Scanning Transmission ◽  
Electron Energy Loss

Vanadium oxide clusters with a mean diameter below 10 nm are created in helium droplets, and after deposition, studied by Scanning Transmission Electron Microscopy (STEM), Electron Energy Loss Spectroscopy (EELS) and UV-vis absorption spectroscopy.

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