Effects of Microstructure on the Electrical Conductivity of SrCo0.8Fe0. 2O3_δ

1999 ◽  
Vol 575 ◽  
Author(s):  
K. Zhang ◽  
M. Miranova ◽  
Y. L. Yang ◽  
A. J. Jacobson ◽  
K. Salama

ABSTRACTThe effect of microstructure on the electrical conductivity of SrCO0.8Fe0.2O3_δ (SCFO) was investigated in air using a four-point dc method. In the test temperature range of 200 to 900 °C, the electrical conductivity of this material was observed to increase with the increase of the average grain size in the lower temperature region where the conductivity increases with the increase of the temperature. The activation energy is decreased with the increase of the grain size in this region, 0.04 ± 0.004 ev for 4.1μm sample and 0.01 ± 0.001 ev for 14.8 μm sample. When temperature is further increased, the conductivity of this material decreases with the increase of the temperature, and the grain size effect becomes less noticeable.

2010 ◽  
Vol 667-669 ◽  
pp. 181-186 ◽  
Author(s):  
Song Ni ◽  
Yan Bo Wang ◽  
Xiao Zhou Liao ◽  
Saleh N. Alhajeri ◽  
H.Q. Li ◽  
...  

The effect of grain size on the deformation twinning and de-twinning in a nanocrystalline Ni-Fe alloy was investigated using transmission electron microscopy. Specimens with different grain sizes were obtained by severely deforming an electrochemically deposited nanocrystalline Ni-20wt.% Fe alloy using high-pressure torsion, which resulted in continuous grain growth from an average grain size of ~ 21 nm in the as-deposited material to ~ 72 nm for the highest strain applied in this study. Results show that deformation de-twinning occurs at very small grain sizes while deformation twinning takes place when the grain size is larger than ~ 45 nm. The mechanism of the observed grain size effect on twinning and de-twinning is briefly discussed.


2016 ◽  
Author(s):  
Sweety Supriya ◽  
Sunil Kumar ◽  
Manoranjan Kar

2018 ◽  
Vol 44 (17) ◽  
pp. 21507-21513 ◽  
Author(s):  
Q.B. Chen ◽  
B. Meng ◽  
M.Y. Zhao ◽  
H. Xie ◽  
L.F. Bian ◽  
...  

2020 ◽  
Author(s):  
Kum-Ok Jang ◽  
Il-Hwan Kim ◽  
Il-Hun Kim ◽  
Kye-Ryong Sin ◽  
Chol-Jin Kim

2014 ◽  
Vol 95 ◽  
pp. 187-191 ◽  
Author(s):  
V. Lacaille ◽  
C. Morel ◽  
E. Feulvarch ◽  
G. Kermouche ◽  
J.-M. Bergheau

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